Fractal and multifractal analysis of LiF thin film surface

Applied Surface Science

Volumn 261, Issue , 2012, Pages 547-553

  Yadav, R P ^a   Dwivedi, S ^a   Mittal, A K ^a   Kumar, M ^a   Pandey, A C ^a  

^a UNIVERSITY OF ALLAHABAD   (India)

Author keywords

Fractal analysis; Height height correlation; LiF thin film; MFDFA; Multifractal analysis

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUTOCORRELATION; FILM THICKNESS; FRACTAL DIMENSION; INTERFACES (MATERIALS); LITHIUM COMPOUNDS;

FRACTAL ANALYSIS; HEIGHT-HEIGHT CORRELATIONS; LIF THIN FILMS; MFDFA; MULTIFRACTAL ANALYSIS;

THIN FILMS;

EID: 84867747486     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.08.053     Document Type: Article

References (32)

1. C.B. Jiang, B. Zhang, Z.Q. Wu, L. Lu, and S.X. Li Lithium fluoride nanowires via vapor-liquid-solid growth Applied Physics Letters 88 2006 093103
2. M. Kumar, S.A. Khan, P. Rajput, F. Singh, A. Tripathi, D.K. Avasthi, and A.C. Pandey Size effect on electronic sputtering of LiF thin films Journal of Applied Physics 102 2007 083510
3. Y. Wang, and K.-W. Xu Characterization of surface morphology of copper tungsten thin film by surface fractal geometry and resistivity Thin Solid Films 468 2004 310 315
4. D. Raoufi Fractal analyses of ITO thin films: a study based on power spectral density Physica B 405 2010 451 455
5. E. Rodroguez-Canas, J.A. Aznarez, A.I. Oliva, and J.L. Sacedon Relationship between the surface morphology and the height distribution curve in thermal evaporated Au thin films Surface Science 600 2006 3110 3120
6. L. Ba, J. Zen, S. Zhang, and Z. Wu Fractals in annealed Ge-Au/Au bilayer films Journal of Applied Physics 77 1995 587
7. N. Almqvist Fractal analysis of scanning probe microscopy images Surface Science 355 1996 221 228
8. Z.W. Chen, J.K.L. Lai, and C.H. Shek Microstructural changes and fractal Ge nanocrystallites in polycrystalline Au/amorphous Ge thin bilayer films upon annealing Journal of Physics D: Applied Physics 39 2006 4544 4548
9. Z. Chen, Q. Li, J. Wang, D. Pan, Z. Jiao, M. Wu, C.-H. Shek, C.M. Lawrence Wu, and J.K.L. Lai Probing into interesting effects of fractal Ge nanoclusters induced by Pd nanoparticles A. C. S. Publications 50 2011 6756 6761
10. D. Raoufi Morphological characterization of ITO thin films surfaces Applied Surface Science 255 2009 3682 3686
11. Z. Chen, D. Pan, B. Zhao, G. Ding, Z. Jiao, M.F C. Wu, H. Shek, L.C.M. Wu, and J.K.L. Lai Insight on fractal assessment strategies for tin dioxide thin films A. C. S. Nano 4 2010 1202 1208
12. G.-F. Gu, and W.-X. Zhou Detrended fluctuation analysis for fractals and multifractals in higher dimensions Physical Review E 74 2006 061104
13. A. Chaudhari, C.-C.S. Yan, and S.-L. Lee Multifractal analysis of growing surfaces Applied Surface Science 238 2004 513 517
14. C. Liu, X.-L. Jiang, T. Liu, L. Zhao, W.-X. Zhou, and W.-K. Yuan Multifractal analysis of the fracture surfaces of foamed polypropylene/ polyethylene blends Applied Surface Science 255 2009 4239 4245
15. D. Raoufi, H.R. Fallah, A. Kiasatpour, and A.S.H. Rozatian Multifractal analysis of ITO thin films prepared by electron beam deposition method Applied Surface Science 254 2008 2168 2173
16. Z. Moktadir, M. Kraft, and H. Wensink Multifractal properties of Pyrex and silicon surfaces blasted with sharp particles Physica A 387 2008 2083 2090
17. Z.W. Chen, X.P. Wang, S. Tan, S.Y. Zhang, J.G. Hou, and Z.Q. Wu Multifractal behavior of crystallization on Au/Ge bilayer films Physical Review B 63 2001 165413
18. R. Buzio, E. Gnecco, C. Boragno, U. Valbusa, P. Piseri, E. Barborini, and P. Milani Self-affine properties of cluster-assembled carbon thin films Surface Science 444 2000 L1 L6
19. 2 Nanoscale Research Letters 4 2009 262 268
20. 2 system Applied Surface Science 253 2007 3455 3463
21. M. Pelliccione, T.-M. Lu, Evolution of Thin Film Morphology, Modeling and Simulation, Springer Series in Material Science, New York, 2008.
22. 3 layers on Si (0 0 1) after postgrowth annealing Thin Solid Films 468 2004 303 309
23. S.K. Sinha, E.B. Sirota, S. Garoff, and H.B. Stanley X-ray and neutron scattering from rough surfaces Physical Review B 38 1988 2297 2311
24. J.W. Kantelhardt, S.A. Zschiegner, E. Koscielny-Bunde, S. Havlin, A. Bunde, and H.E. Stanley Multifractal detrended fluctuation analysis of nonstationary time series Physica A 316 2002 87 114
25. T.C. Halsey, M.H. Jensen, L.P. Kadanoff, I. Procaccia, and B.I. Shraiman Fractal measures and their singularities: the characterization of strange sets Physical Review A 33 1986 1141 1151
26. E. Alessio, A. Carbone, G. Castelli, and V. Frappietro Second-order moving average and scaling of stochastic time series European Physical Journal B 27 2002 197 200
27. A. Carbone, G. Castelli, and H.E. Stanley Time-dependent Hurst exponent in financial time series Physica A 344 2004 267 271
28. A. Carbone Algorithm to estimate the Hurst exponent of high-dimensional fractals Physical Review E 76 2007 056703
29. G.-F. Gu, and W.-X. Zhou Detrending moving average algorithm for multifractals Physical Review E 82 2010 011136
30. C. Turk, A. Carbone, and B.M. Chiaia Fractal heterogeneous media Physical Review E 81 2010 026706
31. Gh. Solookinejad, and M. Jabbari Extracting structural parameters of nanocrystalline ZnO thin films annealed at different temperatures Journal of Applied Sciences 11 2011 2954 2960
32. D. Raoufi, A. Kiasatpour, H.R. Fallah, and A.S.H. Rozatian Surface characterization and microstructure of ITO thin films at different annealing temperatures Applied Surface Science 253 2007 9085 9090