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Volumn 255, Issue 6, 2009, Pages 3682-3686

Morphological characterization of ITO thin films surfaces

Author keywords

Fractal image processing; ITO; Surface morphology; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTAL DIMENSION; GRAIN GROWTH; IMAGE PROCESSING; INDIUM COMPOUNDS; ITO GLASS; MORPHOLOGY; SUBSTRATES; SURFACE MORPHOLOGY; TIN OXIDES;

EID: 57849086370     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.10.020     Document Type: Article
Times cited : (37)

References (19)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.