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Volumn 255, Issue 6, 2009, Pages 3682-3686
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Morphological characterization of ITO thin films surfaces
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Author keywords
Fractal image processing; ITO; Surface morphology; Thin film
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FRACTAL DIMENSION;
GRAIN GROWTH;
IMAGE PROCESSING;
INDIUM COMPOUNDS;
ITO GLASS;
MORPHOLOGY;
SUBSTRATES;
SURFACE MORPHOLOGY;
TIN OXIDES;
ELECTRON BEAM EVAPORATION METHODS;
FRACTAL IMAGES;
GRAIN MORPHOLOGIES;
GROWTH DIRECTIONS;
INDIUM TIN OXIDE THIN FILMS;
MORPHOLOGICAL BEHAVIOR;
MORPHOLOGICAL CHARACTERIZATION;
TOPOGRAPHICAL IMAGES;
THIN FILMS;
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EID: 57849086370
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.10.020 Document Type: Article |
Times cited : (37)
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References (19)
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