Retraction notice to “Morphological, microstructural and optical properties supremacy of binarycomposite films—A study based on Gd2O3/SiO2 system” (Appl. Surf. Sci. (2006) 253 (7) (3455–3463) (S0169433206010075) (10.1016/j.apsusc.2006.07.048));Morphological, microstructural and optical properties supremacy of binary composite films-A study based on Gd2O3/SiO2 system

Applied Surface Science

Volumn 253, Issue 7, 2007, Pages 3455-3463

  Sahoo, N K ^a   Thakur, S ^a   Tokas, R B ^a   Biswas, A ^a   Kamble, N M ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Atomic force microscopy; Co deposition; Composite films; Correlation functions; Electron beam evaporation; Ellipsometry; Optical coatings; Optical thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITE MATERIALS; CORRELATION METHODS; CRYSTAL MICROSTRUCTURE; ELLIPSOMETRY; GADOLINIUM COMPOUNDS; MATHEMATICAL MODELS; MORPHOLOGY; OPTICAL PROPERTIES; OSCILLATORS (MECHANICAL); SILICA;

BAND GAP; BINARY COMPOSITES; CO-DEPOSITION; OPTICAL THIN FILMS; SCANNING PROBE MICROSCOPY;

THIN FILMS;

EID: 33846273138     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2017.10.063     Document Type: Erratum

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