Fractal analyses of ITO thin films: A study based on power spectral density

Physica B: Condensed Matter

Volumn 405, Issue 1, 2010, Pages 451-455

  Raoufi, Davood ^a,b  

^a BU ALI SINA UNIVERSITY   (Iran)

^b UNIVERSITY OF ISFAHAN   (Iran)

Author keywords

Electron beam evaporation; ITO thin film; Power spectral density

Indexed keywords

ANNEALING TEMPERATURES; ELECTRON BEAM EVAPORATION; FRACTAL ANALYSIS; HIGH SPATIAL FREQUENCY; INVERSE POWER LAW; ITO FILMS; ITO THIN FILM; ITO THIN FILMS;

ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; EVAPORATION; FRACTAL DIMENSION; POWER SPECTRAL DENSITY; PRECISION ENGINEERING; THIN FILM DEVICES; THIN FILMS; VAPORS;

TOPOGRAPHY;

EID: 71549153485     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.09.005     Document Type: Article

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