Fractal analysis of scanning probe microscopy images

Surface Science

Volumn 355, Issue 1-3, 1996, Pages 221-228

  Almqvist, N ^a  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

Amorphous surfaces; Atomic force microscopy; Carbon; Computer simulations; Deuterium; Surface structure, morphology, roughness, and topography

Indexed keywords

ALGORITHMS; AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CARBON; COMPUTER SIMULATION; DEUTERIUM; FRACTALS; IMAGE ANALYSIS; MORPHOLOGY;

AREA PERIMETER METHOD; FRACTAL ANALYSIS; SCANNING PROBE MICROSCOPY; SURFACE TOPOGRAPHY;

SURFACE ROUGHNESS;

EID: 0030165537     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01369-5     Document Type: Article

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