Insight on fractal assessment strategies for tin dioxide thin films

ACS Nano

Volumn 4, Issue 2, 2010, Pages 1202-1208

  Chen, Zhiwen ^a,b   Pan, Dengyu ^a   Zhao, Bing ^a   Ding, Guoji ^a   Jiao, Zheng ^a   Wu, Minghong ^a   Shek, Chan Hung ^b   Wu, Lawrence C M ^b   Lai, Joseph K L ^b  

^a SHANGHAI UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Fractal strategies; Gas sensing; Thin films; Tin dioxide

Indexed keywords

AVERAGE SIZE; DIFFERENT SUBSTRATES; ENVIRONMENTAL POLLUTANTS; FORMATION PROCESS; FRACTAL CLUSTERS; FRACTAL FEATURE; FRACTAL METHODS; GAS SENSING; GAS SENSING BEHAVIOR; GAS SENSORS; MEASUREMENTS OF CARBON MONOXIDE; MICRO DEVICES; NETWORK MECHANISM; NEW STRATEGY; PULSED-LASER DEPOSITION TECHNIQUE; TECHNOLOGICAL APPLICATIONS; TIN DIOXIDE THIN FILM; TUNNELING JUNCTIONS;

CARBON MONOXIDE; CHEMICAL DETECTION; DEPOSITION; FRACTAL DIMENSION; FUNCTIONAL MATERIALS; GAS DETECTORS; GAS SENSING ELECTRODES; GASES; POLLUTION DETECTION; PULSED LASER DEPOSITION; PULSED LASERS; STRATEGIC PLANNING; THIN FILMS; TIN; TITANIUM COMPOUNDS;

TIN DIOXIDE;

EID: 77649168119     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn901635f     Document Type: Conference Paper

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