Quantitative temperature profiling through null-point scanning thermal microscopy

International Journal of Thermal Sciences

Volumn 62, Issue , 2012, Pages 109-113

  Chung, J ^a   Kim, K ^b   Hwang, G ^a   Kwon, O ^a   Choi, Y K ^c   Lee, J S ^b  

^a Korea University   (South Korea)

^b Seoul National University   (South Korea)

^c Chung Ang University   (South Korea)

Author keywords

Nanoscale thermal measurement; Null point method; Quantitative temperature profiling; Scanning thermal microscopy (SThM); Thermal conductance; Thermometry

Indexed keywords

NULL-POINT METHOD; SCANNING THERMAL MICROSCOPY; TEMPERATURE PROFILING; THERMAL CONDUCTANCE; THERMAL MEASUREMENTS; THERMOMETRY;

NANOSTRUCTURED MATERIALS;

SCANNING;

EID: 84867745015     PISSN: 12900729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijthermalsci.2011.11.012     Document Type: Conference Paper

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