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Volumn 45, Issue 5, 2012, Pages 982-989

Unambiguous indexing of trigonal crystals from white-beam Laue diffraction patterns: Application to Dauphiné twinning and lattice stress mapping in deformed quartz

Author keywords

Dauphin twinning; quartz; stress tensor mapping; synchrotron X ray Laue microdiffraction; trigonal crystals

Indexed keywords

AIR ABSORPTION; DETECTOR RESPONSE; DIFFRACTION PEAKS; GRAIN ORIENTATION; LATTICE STRESS; LAUE DIFFRACTION; LAUE DIFFRACTION PATTERNS; LAUE MICRODIFFRACTION; LORENTZ FACTOR; STRESS TENSORS; STRUCTURE REFINEMENTS; SYNCHROTRON X RAYS; THEORETICAL STRUCTURE; TRIGONAL SYMMETRY; X RAY BEAM;

EID: 84866525153     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812031287     Document Type: Article
Times cited : (21)

References (28)
  • 19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.