Optical properties of vanadium pentoxide deposited by ALD

Journal of Physical Chemistry C

Volumn 116, Issue 36, 2012, Pages 19444-19450

  Østreng, Erik ^a   Nilsen, Ola ^a   Fjellvåg, Helmer ^a  

^a UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ALD GROWTH; CRYSTAL GROWTH MODEL; CRYSTALLOGRAPHIC ORIENTATIONS; DEPOSITION TEMPERATURES; LITHIUM-ION BATTERY; NUMBER OF CYCLES; TECHNOLOGICAL APPLICATIONS; VANADIUM PENTOXIDE;

CRYSTAL GROWTH; ENERGY GAP; OPTICAL PROPERTIES; OZONE; SURFACE ROUGHNESS; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

ATOMIC LAYER DEPOSITION;

EID: 84866369076     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp304521k     Document Type: Article

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