Correlation between growth conditions, microstructure, and optical properties in pulsed-laser-deposited V2O5 thin films

Chemistry of Materials

Volumn 17, Issue 5, 2005, Pages 1213-1219

  Ramana, C V ^a,c   Smith, R J ^a   Hussain, O M ^b   Chusuei, C C ^c   Julien, C M ^d  

^a MONTANA STATE UNIVERSITY   (United States)

^b SRI VENKATESWARA UNIVERSITY   (India)

^c MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^d SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); MICROSTRUCTURE; MORPHOLOGY; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELEMENTAL DISTRIBUTIONS; GROWTH CONDITIONS; SPECTRAL MEASUREMENTS; SUBSTRATE TEMPERATURE;

VANADIUM COMPOUNDS;

VANADIUM PENTOXIDE;

ARTICLE; CORRELATION ANALYSIS; FILM; OPTICAL DENSITY; PULSED DYE LASER; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; SURFACE PROPERTY; TEMPERATURE; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 14844291403     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm048507m     Document Type: Article

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