Dielectric function of V2O5 nanocrystalline films by spectroscopic ellipsometry: Characterization of microstructure

Applied Physics Letters

Volumn 77, Issue 8, 2000, Pages 1129-1131

  Losurdo, Maria ^a   Bruno, Giovanni ^a   Barreca, Davide ^b   Tondello, Eugenio ^b  

^a CNR   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006301275     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1289658     Document Type: Article

References (12)

1. A. Telledo and C. G. Granquist, J. Appl. Phys. 77, 4655 (1995).
2. H. Hirashima, M. Ide, and T. Yoshida, J. Non-Cryst. Solids 86, 327 (1986).
3. C. V. Ramana, O M. Hussain, S Uthanna, and B. S. Naidu, Opt. Mater. 10, 101 (1998).
4. A. M. Abo El Soud, B. Mansour, and L. I. Soliman, Thin Solid Films 247, 140 (1994).
5. M. Ghanashyam Krishna and A. K. Bhattacharya, Mater. Sci. Eng., B 49, 166 (1997).
6. J. C. Parker, D. J. Lam, Y. N. Xu, and W. Y. Ching, Phys. Rev. B 42, 5289 (1990).
7. V. G. Mokerov, V. L. Makarov, V. B. Tulvinskii, and A. R. Begishev, Opt. Spectrosc. 40, 58 (1976).
8. D. Barreca, L. Armelao, F. Caceavale, V. Di Noto, A. Gregori, G. Rizzi, and E. Tondello, Chem. Mater. 12, 98 (2000).
9. Measurements were performed by T. Wagner with the VASE® spectroscopic ellipsometer at LOT-Oriel GmbH & Co. KG, J. A. Wollam Co., Inc.
10. G. E. Jellison, Thin Solid Films 313, 33 (1998).
11. D. A. G. Bruggemann, Ann. Phys. (Leipzig) 24, 636 (1935).
12. D. Barreca, G. A. Battiston, F. Caceavale, V. Di Noto, R. Gerbasi, A. Gregori, G. Rizzi, A. Tiziani, and E. Tondello, J. Phys. IV 9, Pr8-529 (1999).