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Volumn 71, Issue 3, 2010, Pages 223-229

Thermal annealing effect on the crystallization and optical dispersion of sprayed V2O5 thin films

Author keywords

A. Thin Films

Indexed keywords

A. THIN FILMS; ANNEALING PROCESS; ANNEALING TIME; AS-DEPOSITED FILMS; DEGREE OF CRYSTALLINITY; DIELECTRIC CONSTANTS; EFFECTIVE MASS; GLASS SUBSTRATES; OPTICAL ABSORPTION; OPTICAL DISPERSION; ORTHORHOMBIC STRUCTURES; OSCILLATOR STRENGTHS; PLASMA FREQUENCIES; POLYCRYSTALLINE; PREFERENTIAL ORIENTATION; RESONANT FREQUENCIES; SINGLE OSCILLATORS; SPRAY-PYROLYSIS TECHNIQUES; THERMAL ANNEALING EFFECTS; THERMAL-ANNEALING; VANADIUM PENTOXIDE; WAVELENGTH RANGES; XRD;

EID: 77049109623     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2009.11.009     Document Type: Article
Times cited : (74)

References (35)
  • 21
    • 77049104974 scopus 로고    scopus 로고
    • T. Rechardson, K. von Rottkay, J. Slack, F. Michalak, M. Rubin, Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA94720, USA.
    • T. Rechardson, K. von Rottkay, J. Slack, F. Michalak, M. Rubin, Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA94720, USA.
  • 23
    • 15344347378 scopus 로고
    • Sato Y. Vacuum 41 (1990) 1178
    • (1990) Vacuum , vol.41 , pp. 1178
    • Sato, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.