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Volumn 112, Issue 3, 2012, Pages

Aging process of unipolar resistive switching in microscale cylindrical Fe-base alloy/TiO 2/Au-cells

Author keywords

[No Author keywords available]

Indexed keywords

AGING PROCESS; APPLIED VOLTAGES; BLOCKING BARRIER; DEPLETION LAYER; FE-BASE ALLOY; HIGH ELECTRIC FIELDS; MICRO-SCALES; MOBILE SPECIES; RESISTANCE SWITCHING; RESISTIVE SWITCHING; TIO; VOLTAGE SWEEP;

EID: 84865226669     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4744109     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.