메뉴 건너뛰기




Volumn 86, Issue 5, 2012, Pages

Intrinsic defects and conduction characteristics of Sc 2O 3 in thermionic cathode systems

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84864955009     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.054106     Document Type: Article
Times cited : (28)

References (71)
  • 1
    • 44649094468 scopus 로고    scopus 로고
    • Plasma physics and related challenges of millimeter-wave-to-terahertz and high power microwave generation
    • DOI 10.1063/1.2838240
    • J. H. Booske, Phys. Plasmas PHPAEN 1070-664X 10.1063/1.2838240 15, 055502 (2008). (Pubitemid 351776712)
    • (2008) Physics of Plasmas , vol.15 , Issue.5 , pp. 055502
    • Booske, J.H.1
  • 2
    • 84864918897 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Wisconsin-Madison
    • V. Vlahos, Ph.D. thesis, University of Wisconsin-Madison, 2009.
    • (2009)
    • Vlahos, V.1
  • 5
    • 34247891537 scopus 로고    scopus 로고
    • Development of high current-density cathodes with scandia-doped tungsten powders
    • DOI 10.1109/TED.2007.894602, Special Issue on Spintronics
    • W. Yiman, W. Jinshu, L. Wei, Z. Ke, and L. Ji, IEEE Trans. Electron Devices IETDAI 0018-9383 10.1109/TED.2007.894602 54, 1061 (2007). (Pubitemid 46691559)
    • (2007) IEEE Transactions on Electron Devices , vol.54 , Issue.5 , pp. 1061-1070
    • Wang, Y.1    Wang, J.2    Liu, W.3    Zhang, K.4    Li, J.5
  • 13
    • 0038377496 scopus 로고    scopus 로고
    • MSBTEK 0921-5107 10.1016/S0921-5107(02)00503-2
    • S. W. Lee, A. Daga, Z. K. Xu, and H. Chen, Mater. Sci. Eng. B MSBTEK 0921-5107 10.1016/S0921-5107(02)00503-2 99, 134 (2003).
    • (2003) Mater. Sci. Eng. B , vol.99 , pp. 134
    • Lee, S.W.1    Daga, A.2    Xu, Z.K.3    Chen, H.4
  • 14
    • 0035803355 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.1424072
    • Z. Xu, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1424072 79, 3782 (2001).
    • (2001) Appl. Phys. Lett. , vol.79 , pp. 3782
    • Xu, Z.1
  • 17
    • 0008795781 scopus 로고
    • JPCSAW 0022-3697 10.1016/0022-3697(66)90081-3
    • H. H. Tippins, J. Phys. Chem. Solids JPCSAW 0022-3697 10.1016/0022-3697(66)90081-3 27, 1069 (1966).
    • (1966) J. Phys. Chem. Solids , vol.27 , pp. 1069
    • Tippins, H.H.1
  • 19
    • 70749143838 scopus 로고    scopus 로고
    • ASUSEE 0169-4332 10.1016/j.apsusc.2009.05.116
    • Y. Nakanishi, T. Nagatomi, and Y. Takai, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/j.apsusc.2009.05.116 256, 1082 (2009).
    • (2009) Appl. Surf. Sci. , vol.256 , pp. 1082
    • Nakanishi, Y.1    Nagatomi, T.2    Takai, Y.3
  • 20
    • 0242578252 scopus 로고    scopus 로고
    • SUSCAS 0039-6028 10.1016/j.susc.2003.10.008
    • T. Tsujita, S. Iida, T. Nagatomi, and Y. Takai, Surf. Sci. SUSCAS 0039-6028 10.1016/j.susc.2003.10.008 547, 99 (2003).
    • (2003) Surf. Sci. , vol.547 , pp. 99
    • Tsujita, T.1    Iida, S.2    Nagatomi, T.3    Takai, Y.4
  • 22
    • 77954792693 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.81.054207
    • V. Vlahos, J. H. Booske, and D. Morgan, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.81.054207 81, 054207 (2010).
    • (2010) Phys. Rev. B , vol.81 , pp. 054207
    • Vlahos, V.1    Booske, J.H.2    Morgan, D.3
  • 25
    • 2442537377 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.54.11169
    • G. Kresse and J. Furthmuller, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.54.11169 54, 11169 (1996).
    • (1996) Phys. Rev. B , vol.54 , pp. 11169
    • Kresse, G.1    Furthmuller, J.2
  • 26
    • 2842565972 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.54.16533
    • J. P. Perdew, K. Burke, and Y. Wang, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.54.16533 54, 16533 (1996).
    • (1996) Phys. Rev. B , vol.54 , pp. 16533
    • Perdew, J.P.1    Burke, K.2    Wang, Y.3
  • 27
    • 0011236321 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.59.1758
    • G. Kresse and D. Joubert, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.59.1758 59, 1758 (1999).
    • (1999) Phys. Rev. B , vol.59 , pp. 1758
    • Kresse, G.1    Joubert, D.2
  • 28
    • 1842816907 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.13.5188
    • H. J. Monkhorst and J. D. Pack, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.13.5188 13, 5188 (1976).
    • (1976) Phys. Rev. B , vol.13 , pp. 5188
    • Monkhorst, H.J.1    Pack, J.D.2
  • 34
    • 84942070736 scopus 로고
    • 0044-2968 10.1524/zkri.1967.124.1-2.136
    • S. Geller, P. Romo, and J. P. Remeika, Z. Kristallogr. 0044-2968 10.1524/zkri.1967.124.1-2.136 124, 136 (1966).
    • (1966) Z. Kristallogr. , vol.124 , pp. 136
    • Geller, S.1    Romo, P.2    Remeika, J.P.3
  • 41
    • 0141917879 scopus 로고    scopus 로고
    • (National Institute of Standards and Technology, Gaithersburg, MD
    • NIST Chemistry WebBook, NIST Standard Reference Database No. 69, edited by P. J. Linstrom and W. G. Mallard (National Institute of Standards and Technology, Gaithersburg, MD, 2003), http://webbook.nist.gov/chemistry/.
    • (2003) NIST Chemistry WebBook
    • Linstrom, P.J.1    Mallard, W.G.2
  • 45
    • 0000934120 scopus 로고
    • 10.1088/0022-3719/18/5/005
    • M. Leslie and N. J. Gillan, J. Phys. C 10.1088/0022-3719/18/5/005 18, 973 (1985).
    • (1985) J. Phys. C , vol.18 , pp. 973
    • Leslie, M.1    Gillan, N.J.2
  • 46
    • 0001671054 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.51.4014
    • G. Makov and M. C. Payne, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.51.4014 51, 4014 (1995).
    • (1995) Phys. Rev. B , vol.51 , pp. 4014
    • Makov, G.1    Payne, M.C.2
  • 48
    • 84857739523 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.85.064106
    • B. Puchala and D. Morgan, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.85.064106 85, 064106 (2012).
    • (2012) Phys. Rev. B , vol.85 , pp. 064106
    • Puchala, B.1    Morgan, D.2
  • 50
    • 33244472623 scopus 로고    scopus 로고
    • Managing the supercell approximation for charged defects in semiconductors: Finite-size scaling, charge correction factors, the band-gap problem, and the ab initio dielectric constant
    • DOI 10.1103/PhysRevB.73.035215, 035215
    • C. W. M. Castleton, A. Höglund, and S. Mirbt, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.73.035215 73, 035215 (2006). (Pubitemid 43273418)
    • (2006) Physical Review B - Condensed Matter and Materials Physics , vol.73 , Issue.3 , pp. 1-11
    • Castleton, C.W.M.1    Hoglund, A.2    Mirbt, S.3
  • 52
  • 54
    • 79961234511 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.83.245207
    • J. Ma, S.-H. Wei, T. A. Gessert, and K. K. Chin, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.83.245207 83, 245207 (2011).
    • (2011) Phys. Rev. B , vol.83 , pp. 245207
    • Ma, J.1    Wei, S.-H.2    Gessert, T.A.3    Chin, K.K.4
  • 56
    • 77958510338 scopus 로고    scopus 로고
    • 1476-1122 10.1038/nmat2888
    • D. G. Schlom and L. N. Pfeiffer, Nat. Mater. 1476-1122 10.1038/nmat2888 9, 881 (2010).
    • (2010) Nat. Mater. , vol.9 , pp. 881
    • Schlom, D.G.1    Pfeiffer, L.N.2
  • 58
    • 36749111931 scopus 로고
    • APPLAB 0003-6951 10.1063/1.88200
    • R. Hughes, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.88200 26, 436 (1975).
    • (1975) Appl. Phys. Lett. , vol.26 , pp. 436
    • Hughes, R.1
  • 59
    • 33751517073 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1702560
    • R. Weiher, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1702560 33, 2834 (1962).
    • (1962) J. Appl. Phys. , vol.33 , pp. 2834
    • Weiher, R.1
  • 63
    • 11744371840 scopus 로고
    • PHRVAO 0031-899X 10.1103/PhysRev.87.457
    • E. M. Pell, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.87.457 87, 457 (1952).
    • (1952) Phys. Rev. , vol.87 , pp. 457
    • Pell, E.M.1
  • 64
    • 0035128951 scopus 로고    scopus 로고
    • Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions
    • DOI 10.1016/S0026-2714(00)00227-4
    • C. E. Schuster, M. G. Vangel, and H. A. Schafft, Microelectronics Reliability 0026-2714 10.1016/S0026-2714(00)00227-4 41, 239 (2001). (Pubitemid 32139371)
    • (2001) Microelectronics Reliability , vol.41 , Issue.2 , pp. 239-252
    • Schuster, C.E.1    Vangel, M.G.2    Schafft, H.A.3
  • 65
  • 70
    • 0037463217 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/S0040-6090(03)00015-4
    • M. F. Al-Kuhaili, Thin Solid Films THSFAP 0040-6090 10.1016/S0040- 6090(03)00015-4 426, 178 (2003).
    • (2003) Thin Solid Films , vol.426 , pp. 178
    • Al-Kuhaili, M.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.