Structure of Sc 2O 3 films epitaxially grown on α-Al 2O 3 (0001)

Applied Physics Letters

Volumn 88, Issue 2, 2006, Pages 1-3

  Kortan, A R ^a   Kopylov, N ^a   Kwo, J ^b   Hong, M ^b   Chen, C P ^b   Mannaerts, J P ^b   Liou, S H ^c  

^a OFS LABORATORIES   (United States)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIXBYITE PHASE; SCANDIUM OXIDE; SINGLE-CRYSTAL X-RAY DIFFRACTION;

ALUMINUM; CRYSTAL ATOMIC STRUCTURE; SAPPHIRE; SCANDIUM; SINGLE CRYSTALS; STRUCTURAL ANALYSIS; THICKNESS MEASUREMENT; X RAY DIFFRACTION;

FILM GROWTH;

EID: 30744449486     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2163989     Document Type: Article

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