Optical properties of scandium oxide films prepared by electron beam evaporation

Thin Solid Films

Volumn 426, Issue 1-2, 2003, Pages 178-185

  Al Kuhaili, M F ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

Optical coatings; Optical properties; Oxides

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON BEAMS; REFRACTIVE INDEX; THIN FILMS; TITANIUM NITRIDE; X RAY DIFFRACTION ANALYSIS;

ELECTRON BEAM EVAPORATION;

SCANDIUM COMPOUNDS;

EID: 0037463217     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00015-4     Document Type: Article

References (21)

1. Grosso D., Sermon P.A. Thin Solid Films. 368:2000;116.
2. Rainer F., Lowdermilk W.H., Milam D., Tuttle Hart T., Lichtenstein T.L., Carniglia C.K. Appl. Opt. 21:1982;3685.
3. Tamura S., Kimura S., Sato Y., Yoshida H., Yoshida K. Thin Solid Films. 228:1993;222.
4. Heitmann W. Appl. Opt. 12:1973;394.
5. Arndt D.P., Azzam R.M., Bennett J.M., Borgogno J.P., Carniglia C.K., Case W.E., Dobrowolski J.A., Gibson U.J., Tuttle Hart T., Ho F.C., Hodgkin V.A., Klapp W.P., Macleod H.A., Pelletier E., Purvis M.K., Quinn D.M., Strome D.H., Swenson R., Temple P.A., Thonn T.F. Appl. Opt. 23:1984;3571.
6. Xu Z., Daga A., Chen H. Appl. Phys. Lett. 79:2001;3782.
7. Harris M., Macleod H.A., Ogura S., Pelletier E., Vidal B. Thin Solid Films. 57:1978;173.
8. Wyckoff R.W. Crystal Structures, vol. 2. second ed. 1964;Interscience Publishers, New York.
9. Adamik M., Barna P.B., Tomov I. Thin Solid Films. 317:1998;64.
10. Kulkarni A.K., Schulz K.H., Lim T.S., Khan M. Thin Solid Films. 345:1999;273.
11. Meng L.-J., dos Santos M.P. Thin Solid Films. 322:1998;56.
12. Adamik M., Barna P.B., Tomov I., Biro D. Phys. Status Solidi (A). 145:1994;275.
13. Zhang S., Xiao R. J. Appl. Phys. 83:1998;3842.
14. Cullity B.D. Elements of X-ray Diffraction. second ed. 1978;Addison-Wesley, Reading, MA.
15. Gonzalez-Elipe A.R., Espinos J.P., Fernandez A., Munuera G. Appl. Surf. Sci. 45:1990;103.
16. Chastain J. Handbook of X-ray Photoelectron Spectroscopy. 1992;Perkin-Elmer, Eden Prairie, MN.
17. Borgogno J.P., Lazarides B., Pelletier E. Appl. Opt. 21:1982;4020.
18. Khawaja E.E., Durrani S.M.A., Daous M.A. J. Phys. D. 32:1999;388.
19. Heavens O.S. Optical Properties of Thin Solid Films. 1991;Dover, New York, NY.
20. Mergel D., Buschendorf D., Eggert S., Grammes R., Samset S. Thin Solid Films. 371:2000;218.
21. Khawaja E.E., Bouamrane F., Al-Adel F., Hallak A.B., Daous M.A., Salim M.A. Thin Solid Films. 240:1994;121.