In situ emission microscopy of Scandium/Scandium-Oxide and Barium/ Barium-Oxide thin films on tungsten

IEEE Transactions on Electron Devices

Volumn 56, Issue 5, 2009, Pages 794-798

  Vaughn, Joel M ^a   Jamison, Keith D ^b   Kordesch, Martin E ^a  

^a OHIO UNIVERSITY   (United States)

^b Nanohmics Inc   (United States)

Author keywords

Photoelectron emission microscopy (PEEM); Scandate cathode; Thermionic cathode; Thermionic emission microscopy (ThEEM)

Indexed keywords

BASE LAYERS; EMISSION MICROSCOPY; IN-SITU; OXIDE THIN FILMS; PHOTOELECTRON EMISSION MICROSCOPY; PHOTOELECTRON EMISSION MICROSCOPY (PEEM); SCANDATE CATHODE; THERMIONIC ELECTRON EMISSION;

ADSORPTION; BARIUM; DESORPTION; OXIDE FILMS; PHOTOIONIZATION; PHOTONS; SCANDIUM; SURFACE DIFFUSION; THERMIONIC CATHODES; THERMIONIC EMISSION; TUNGSTEN;

ELECTRONS;

EID: 67349157166     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2015410     Document Type: Article

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