Edge termination impact on clamped inductive turn-off failure in high-voltage IGBTs under overcurrent conditions

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn , Issue , 2011, Pages 112-115

  Perpina, X ^a   Cortes, I ^a   Urresti Ibanez, J ^a   Jorda, X ^a   Rebollo, J ^a   Millan, J ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE TERMINATION; EXPERIMENTAL TEST; HIGH-VOLTAGE IGBT; HIGH-VOLTAGES; OVERLOAD CURRENTS; POWER MODULE; RAILWAY TRACTION; TCAD SIMULATION;

EID: 84864759047     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2011.5890803     Document Type: Conference Paper

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