-
2
-
-
70549094126
-
Aluminum-Germanium eutectic bonding for 3D integration
-
doi:10.1109/3DIC.2009.5306531
-
Crnogorac F, Dauskardt R, Pease F (2009) Aluminum-Germanium eutectic bonding for 3D integration. In: IEEE Proceedings (3D IC), pp 1-5. doi:10.1109/3DIC.2009.5306531
-
(2009)
IEEE Proceedings (3D IC)
, pp. 1-5
-
-
Crnogorac, F.1
Dauskardt, R.2
Pease, F.3
-
3
-
-
79952645871
-
Wafer bonding process selection
-
doi:10.1149/1.3483542
-
Dragoi V, Pabo E (2010) Wafer bonding process selection. ECS Trans 33(4):509-517. doi:10.1149/1.3483542
-
(2010)
ECS Trans
, vol.33
, Issue.4
, pp. 509-517
-
-
Dragoi, V.1
Pabo, E.2
-
4
-
-
29744442846
-
Low temperature MEMS manufacturing processes: Plasma activated wafer bonding
-
Dragoi V, Farrens S, Lindner P (2005) Low temperature MEMS manufacturing processes: plasma activated wafer bonding. MRS Proc 872: J7.1.1-J7.1.6
-
(2005)
MRS Proc
, vol.872
-
-
Dragoi, V.1
Farrens, S.2
Lindner, P.3
-
6
-
-
79952661828
-
Metal thermocompression wafer bonding for 3D integration and MEMS applications
-
doi:10.1149/1.3483491
-
Dragoi V, Mittendorfer G, Burggraf J, Wimplinger M (2010b) Metal thermocompression wafer bonding for 3D integration and MEMS applications. ECS Trans 33(4):27-35. doi:10.1149/1.3483491
-
(2010)
ECS Trans
, vol.33
, Issue.4
, pp. 27-35
-
-
Dragoi, V.1
Mittendorfer, G.2
Burggraf, J.3
Wimplinger, M.4
-
7
-
-
84891309209
-
-
Wiley-VCH, Weinheim, ISBN: 978-3-527-32034-9
-
Garrou P, Bower C, Ramm P (eds) (2008) Handbook of 3D integration: technology and applications of 3Dintegrated circuits, vol 1, Wiley-VCH, Weinheim, p 26. ISBN: 978-3-527-32034-9
-
(2008)
Handbook of 3D Integration: Technology and Applications of 3Dintegrated Circuits
, vol.1
, pp. 26
-
-
Garrou, P.1
Bower, C.2
Ramm, P.3
-
8
-
-
77950087233
-
Principles of soldering
-
Materials Park, OH. ISBN: 978-0-87170-792-5
-
Humpston G, Jacobson D (2004) Principles of Soldering. ASM International, Materials Park, OH, p 231. ISBN: 978-0-87170-792-5
-
(2004)
ASM International
, pp. 231
-
-
Humpston, G.1
Jacobson, D.2
-
9
-
-
64549086424
-
Effect of post-annealing conditions on Cu-Cu wafer bonding characteristics
-
Jang EJ, Park YB, Pfeiffer S, Kim B, Matthias T, Hyun S, Lee HJ (2009) Effect of post-annealing conditions on Cu-Cu wafer bonding characteristics. J Kor Phys Soc 54:1278-1282
-
(2009)
J Kor Phys Soc
, vol.54
, pp. 1278-1282
-
-
Jang, E.J.1
Park, Y.B.2
Pfeiffer, S.3
Kim, B.4
Matthias, T.5
Hyun, S.6
Lee, H.J.7
-
11
-
-
0348199188
-
Dielectric glue wafer bonding for 3D ICs
-
Kwon Y, Jindal A, McMahon JJ, Lu J-Q, Gutman RJ, Cale TS (2003) Dielectric glue wafer bonding for 3D ICs. MRS Proc 766: E5.8.1
-
(2003)
MRS Proc
, vol.766
-
-
Kwon, Y.1
Jindal, A.2
McMahon, J.J.3
Lu, J.-Q.4
Gutman, R.J.5
Cale, T.S.6
-
12
-
-
70449581032
-
3D Integration using adhesive, metal, and metal/adhesive as wafer bonding interfaces
-
Lu J-Q, McMahon JJ, Gutmann RJ (2009) 3D Integration using adhesive, metal, and metal/adhesive as wafer bonding interfaces. MRS Proc 1112: 1112-E02-01
-
(2009)
MRS Proc
, vol.1112
-
-
Lu, J.-Q.1
McMahon, J.J.2
Gutmann, R.J.3
-
13
-
-
63149117462
-
Plasma activation for low temperature wafer bonding
-
doi:10.1149/1.2982910
-
Plach T, Dragoi V, Murauer F, Hingerl K (2008) Plasma activation for low temperature wafer bonding. ECS Trans 13(25):549-559. doi:10.1149/1.2982910
-
(2008)
ECS Trans
, vol.13
, Issue.25
, pp. 549-559
-
-
Plach, T.1
Dragoi, V.2
Murauer, F.3
Hingerl, K.4
-
14
-
-
33750697638
-
Room temperature metal direct bonding
-
Tong Q-Y (2006) Room temperature metal direct bonding. Appl Phys Lett 89:182101
-
(2006)
Appl Phys Lett
, vol.89
, pp. 182101
-
-
Tong, Q.-Y.1
-
16
-
-
47249118157
-
Gold-indium transient liquid phase (TLP) wafer bonding for MEMS vacuum packaging
-
doi:10.1109/MEMSYS.2008.4443779
-
Welch WC III, Najafi K (2008) Gold-indium transient liquid phase (TLP) wafer bonding for MEMS vacuum packaging. Proc IEEE MEMS 2008:806. doi:10.1109/MEMSYS.2008.4443779
-
(2008)
Proc IEEE MEMS
, vol.2008
, pp. 806
-
-
Welch Iii, W.C.1
Najafi, K.2
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