메뉴 건너뛰기




Volumn , Issue , 2009, Pages

Aluminum-germanium eutectic bonding for 3D integration

Author keywords

3DIC; Al Ge eutectic; Monolithic integration; Wafer bonding

Indexed keywords

3-D INTEGRATION; AL-GE EUTECTIC; BI-LAYER FILMS; DOUBLE CANTILEVER BEAM; EUTECTIC BONDING; EUTECTIC COMPOSITION; LIQUID PHASE; LOW TEMPERATURES; MONOLITHIC INTEGRATION; MONOLITHICALLY INTEGRATED; SILICON ISLANDS; THREE DIMENSIONAL INTEGRATED CIRCUITS; UPPER LAYER; VOID-FREE;

EID: 70549094126     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/3DIC.2009.5306531     Document Type: Conference Paper
Times cited : (11)

References (16)
  • 5
    • 24144488224 scopus 로고    scopus 로고
    • Process development and bonding quality investigations of silicon layer stacking based on copper wafer bonding
    • K.N. Chen, S.M. Chang, A. Fan, C.S. Tan, L.C. Shen, R. Reif, "Process development and bonding quality investigations of silicon layer stacking based on copper wafer bonding," Appl. Phys. Lett., vol. 87, pp. 031909, 2005.
    • (2005) Appl. Phys. Lett , vol.87 , pp. 031909
    • Chen, K.N.1    Chang, S.M.2    Fan, A.3    Tan, C.S.4    Shen, L.C.5    Reif, R.6
  • 7
    • 0008824304 scopus 로고    scopus 로고
    • Patterned eutectic bonding with Al/Ge thin films for microelectromechanical systems
    • Jul/Aug
    • B. Vu, P.M. Zavracky, "Patterned eutectic bonding with Al/Ge thin films for microelectromechanical systems," J. Vac. Sci. Technol. B, vol. 14, no. 4, pp. 2588-2594, Jul/Aug 1996.
    • (1996) J. Vac. Sci. Technol. B , vol.14 , Issue.4 , pp. 2588-2594
    • Vu, B.1    Zavracky, P.M.2
  • 9
    • 61749100546 scopus 로고    scopus 로고
    • Structure of vapor-phase deposited Al-Ge thin films and Al-Ge intermediate layer bonding of Albased microchannel structures
    • Feb
    • F. Mei, W.J. Meng, J. Hiller, D.J. Miller, "Structure of vapor-phase deposited Al-Ge thin films and Al-Ge intermediate layer bonding of Albased microchannel structures," J.Mater. Res., vol. 24, no. 2, pp. 544-555, Feb. 2009.
    • (2009) J.Mater. Res , vol.24 , Issue.2 , pp. 544-555
    • Mei, F.1    Meng, W.J.2    Hiller, J.3    Miller, D.J.4
  • 11
    • 0015589054 scopus 로고
    • An augmented double cantilever beam model for studying crack propagation and arrest
    • Mar
    • M.F. Kanninen, "An augmented double cantilever beam model for studying crack propagation and arrest," International Journal of Fracture, vol. 9, no. 1, pp. 83-92, Mar. 1973.
    • (1973) International Journal of Fracture , vol.9 , Issue.1 , pp. 83-92
    • Kanninen, M.F.1
  • 13
    • 3342906170 scopus 로고
    • Diffusivity and solubility of Si in Al metalization of integrated circuits
    • Dec
    • J.O. McCaldin, H. Sankur, "Diffusivity and solubility of Si in Al metalization of integrated circuits," J. App. Phys., vol. 19, no. 12, pp. 524-527, Dec. 1971.
    • (1971) J. App. Phys , vol.19 , Issue.12 , pp. 524-527
    • McCaldin, J.O.1    Sankur, H.2
  • 14
    • 51249161800 scopus 로고
    • On the Al-Ge, Al- Si and Al-Ge-Si systems, and their application to brazing in high power semiconductor devices
    • F.H. Hayes, R.D. Longbottom, E. Ahmad, G. Chen, "On the Al-Ge, Al- Si and Al-Ge-Si systems, and their application to brazing in high power semiconductor devices," Journal of Phase Equilibria, vol. 14, no. 4, pp. 525-431, 1993.
    • (1993) Journal of Phase Equilibria , vol.14 , Issue.4 , pp. 525-431
    • Hayes, F.H.1    Longbottom, R.D.2    Ahmad, E.3    Chen, G.4
  • 15
    • 0007983631 scopus 로고    scopus 로고
    • A study of the failure mechanism of a titanium nitride diffusion barrier
    • Sep
    • H-J. Lee, R. Sinclair, P. Li, B. Roberts, "A study of the failure mechanism of a titanium nitride diffusion barrier," J. App. Phys. vol. 86, no. 6, pp. 3096-3103, Sep. 1999.
    • (1999) J. App. Phys , vol.86 , Issue.6 , pp. 3096-3103
    • Lee, H.-J.1    Sinclair, R.2    Li, P.3    Roberts, B.4
  • 16
    • 0030260073 scopus 로고    scopus 로고
    • Transfer of structured and patterned thin silicon films using the Smart-Cut(R) process
    • Oct
    • B. Aspar, M. Bruel, M. Zussy, A.M. Cartier, "Transfer of structured and patterned thin silicon films using the Smart-Cut(R) process," Electronics Letters, vol. 32, no. 21, pp.1985-1986, Oct. 1996.
    • (1996) Electronics Letters , vol.32 , Issue.21 , pp. 1985-1986
    • Aspar, B.1    Bruel, M.2    Zussy, M.3    Cartier, A.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.