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Volumn 111, Issue 9, 2012, Pages

Conduction mechanism of resistive switching films in MgO memory devices

Author keywords

[No Author keywords available]

Indexed keywords

COMPLIANCE CURRENT; CONDUCTION MECHANISM; EFFECTIVE DENSITY OF STATE; ELECTRICAL PARAMETER; HIGH-RESISTANCE STATE; HOPPING CONDUCTION; LOW-RESISTANCE STATE; MGO; MGO FILMS; NON-POLAR; OHMIC CONDUCTION; RESET CURRENTS; RESISTANCE RATIO; RESISTANCE SWITCHING; RESISTIVE SWITCHING; TRAP ENERGY LEVELS;

EID: 84864231122     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4712628     Document Type: Article
Times cited : (55)

References (27)
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    • 10.1109/JPROC.2010.2070830
    • H. Akinaga and H. Shima, Proc. IEEE 98, 2237 (2010). 10.1109/JPROC.2010. 2070830
    • (2010) Proc. IEEE , vol.98 , pp. 2237
    • Akinaga, H.1    Shima, H.2
  • 3
    • 43549126477 scopus 로고    scopus 로고
    • 10.1016/S1369-7021(08)70119-6
    • A. Sawa, Mater. Today 11, 28 (2008). 10.1016/S1369-7021(08)70119-6
    • (2008) Mater. Today , vol.11 , pp. 28
    • Sawa, A.1
  • 9
  • 23
    • 84857947146 scopus 로고    scopus 로고
    • The application of high-dielectric-constant and ferroelectric thin films in integrated circuit technology
    • edited by T. Y. Tseng and H. S. Nalwa (American Scientific Publishers, Los Angeles, California, USA)
    • J. Y. M. Lee, F. C. Chiu, and P. C. Juan, The application of high-dielectric-constant and ferroelectric thin films in integrated circuit technology., in Handbook of Nanoceramics and Their Based Nanodevices, edited by, T. Y. Tseng, and, H. S. Nalwa, (American Scientific Publishers, Los Angeles, California, USA, 2009), Vol. 4, p. 159.
    • (2009) Handbook of Nanoceramics and Their Based Nanodevices , vol.4 , pp. 159
    • Lee, J.Y.M.1    Chiu, F.C.2    Juan, P.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.