-
2
-
-
79951838738
-
High density 3D integration using CMOS foundry technologies for 28 nm node and beyond
-
J.-C. Lin, W.-C. Chiou, K.-F. Yang, H.-B. Chang, Y.-C. Lin, and E.-B. Liao High density 3D integration using CMOS foundry technologies for 28 nm node and beyond Electronic Components Technol Conf IEDM 10 2010 22 25
-
(2010)
Electronic Components Technol Conf IEDM
, vol.10
, pp. 22-25
-
-
Lin, J.-C.1
Chiou, W.-C.2
Yang, K.-F.3
Chang, H.-B.4
Lin, Y.-C.5
Liao, E.-B.6
-
3
-
-
77957003623
-
Electromigration and thermomigration in Pb-free flip-chip solder joints
-
C. Chen, H.-M. Tong, and K.-N. Tu Electromigration and thermomigration in Pb-free flip-chip solder joints Annu Rev Mater Res 40 2010 531 555
-
(2010)
Annu Rev Mater Res
, vol.40
, pp. 531-555
-
-
Chen, C.1
Tong, H.-M.2
Tu, K.-N.3
-
4
-
-
33646681929
-
Thermomigration in SnPb composite flip chip solder joints
-
A.-T. Huang, A.-M. Gusak, K.-N. Du, and Y.-S. Lai Thermomigration in SnPb composite flip chip solder joints Appl Phys Lett 88 2006 141911 141913
-
(2006)
Appl Phys Lett
, vol.88
, pp. 141911-141913
-
-
Huang, A.-T.1
Gusak, A.-M.2
Du, K.-N.3
Lai, Y.-S.4
-
5
-
-
62149085090
-
Thermomigration in Pb-free SnAg solder joint under alternating current stressing
-
H.-Y. Hsiao, and C. Chen Thermomigration in Pb-free SnAg solder joint under alternating current stressing Appl Phys Lett 94 2009 092107 092109
-
(2009)
Appl Phys Lett
, vol.94
, pp. 092107-092109
-
-
Hsiao, H.-Y.1
Chen, C.2
-
6
-
-
84862829206
-
Thermomigration of Ti in flip-chip solder joints
-
H.-Y. Chen, H.-W. Lin, C.-M. Liu, Y.-W. Chang, A.-T. Huang, and C. Chen Thermomigration of Ti in flip-chip solder joints Scri Mater 66 2012 694 697
-
(2012)
Scri Mater
, vol.66
, pp. 694-697
-
-
Chen, H.-Y.1
Lin, H.-W.2
Liu, C.-M.3
Chang, Y.-W.4
Huang, A.-T.5
Chen, C.6
-
8
-
-
29844448941
-
High electric current density-induced interfacial reactions in micro ball grid array (μBGA) solder joints
-
M.-O. Alam, B.-Y. Wu, Y.-C. Chan, and K.-N. Tu High electric current density-induced interfacial reactions in micro ball grid array (μBGA) solder joints Acta Mater 54 2006 613 621
-
(2006)
Acta Mater
, vol.54
, pp. 613-621
-
-
Alam, M.-O.1
Wu, B.-Y.2
Chan, Y.-C.3
Tu, K.-N.4
-
9
-
-
77349122538
-
Failure mechanisms of solder interconnects under current stressing in advanced electronic packages
-
Y.-C. Chan, and D. Yang Failure mechanisms of solder interconnects under current stressing in advanced electronic packages Prog Mater Sci 55 2010 428 475
-
(2010)
Prog Mater Sci
, vol.55
, pp. 428-475
-
-
Chan, Y.-C.1
Yang, D.2
-
10
-
-
52949145973
-
Failure induced by thermomigration of interstitial Cu in Pb-free flip chip solder joints
-
H.-Y. Chen, C. Chen, and K.-N. Tu Failure induced by thermomigration of interstitial Cu in Pb-free flip chip solder joints Appl Phys Lett 93 2008 122103 122105
-
(2008)
Appl Phys Lett
, vol.93
, pp. 122103-122105
-
-
Chen, H.-Y.1
Chen, C.2
Tu, K.-N.3
-
11
-
-
33744825178
-
Asymmetrical solder microstructure in Ni/Sn/Cu solder joint
-
S.-J. Wang, and C.-Y. Liu Asymmetrical solder microstructure in Ni/Sn/Cu solder joint Scr Mater 55 2006 347 350
-
(2006)
Scr Mater
, vol.55
, pp. 347-350
-
-
Wang, S.-J.1
Liu, C.-Y.2
-
12
-
-
84862803844
-
Effect of concentration gradient on interfacial reactions in microbumps of Ni/SnAg/Cu during liquid-state soldering
-
Y.-S. Huang, H.-Y. Hsiao, C. Chen, and K.-N. Tu Effect of concentration gradient on interfacial reactions in microbumps of Ni/SnAg/Cu during liquid-state soldering Scr Mater 66 2012 741 744
-
(2012)
Scr Mater
, vol.66
, pp. 741-744
-
-
Huang, Y.-S.1
Hsiao, H.-Y.2
Chen, C.3
Tu, K.-N.4
-
13
-
-
45549096475
-
3Sn compound formation in Ni/Sn5Ag/Cu solder joint
-
3Sn compound formation in Ni/Sn5Ag/Cu solder joint Mater Lett 62 2008 3887 3889
-
(2008)
Mater Lett
, vol.62
, pp. 3887-3889
-
-
Tseng, H.-W.1
Liu, C.-Y.2
-
15
-
-
0037076832
-
Six cases of reliability study of Pb-free solder joints in electronic packaging technology
-
K. Zeng, and K.-N. Tu Six cases of reliability study of Pb-free solder joints in electronic packaging technology Mater Sci Eng R 38 2002 55 105
-
(2002)
Mater Sci Eng R
, vol.38
, pp. 55-105
-
-
Zeng, K.1
Tu, K.-N.2
-
16
-
-
0000541143
-
A study of solute diffusion in liquid tin
-
C.-H. Ma, and R.-A. Swalin A study of solute diffusion in liquid tin Acta Metall 8 1960 388 395
-
(1960)
Acta Metall
, vol.8
, pp. 388-395
-
-
Ma, C.-H.1
Swalin, R.-A.2
-
17
-
-
0342432746
-
Diffusion of Au and Cu in a temperature gradient
-
C.-J. Meechan, and G.-W. Lehman Diffusion of Au and Cu in a temperature gradient J Appl Phys 33 1962 634 641
-
(1962)
J Appl Phys
, vol.33
, pp. 634-641
-
-
Meechan, C.-J.1
Lehman, G.-W.2
-
18
-
-
0017982959
-
Electromigration, thermomigration, and solubility of copper in lead
-
E. Stracke, and C.-H. Herzig Electromigration, thermomigration, and solubility of copper in lead Phys Stat Sol (a) 47 1978 513 521
-
(1978)
Phys Stat Sol (A)
, vol.47
, pp. 513-521
-
-
Stracke, E.1
Herzig, C.-H.2
-
19
-
-
4243252426
-
Extreme fast-diffusion system: Nickel in single-crystal tin
-
D.-C. Yeh, and H.-B. Huntington Extreme fast-diffusion system: nickel in single-crystal tin Phys Rev Lett 53 1984 1469 1472
-
(1984)
Phys Rev Lett
, vol.53
, pp. 1469-1472
-
-
Yeh, D.-C.1
Huntington, H.-B.2
-
20
-
-
77955212633
-
Assembly and reliability characterization of 3D chip stacking with 30 μm pitch lead-free solder micro bump interconnection
-
C.-J. Zhan, C.-C. Chuang, J.-Y. Juang, S.-T. Lu, and T.-C. Chang Assembly and reliability characterization of 3D chip stacking with 30 μm pitch lead-free solder micro bump interconnection Electronic Components Technol Conf 2010 1043 1049
-
(2010)
Electronic Components Technol Conf
, pp. 1043-1049
-
-
Zhan, C.-J.1
Chuang, C.-C.2
Juang, J.-Y.3
Lu, S.-T.4
Chang, T.-C.5
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