Statistical memristor modeling and case study in neuromorphic computing

Proceedings - Design Automation Conference

Volumn , Issue , 2012, Pages 585-590

  Pino, Robinson E ^a   Li, Hai ^b   Chen, Yiran ^c   Hu, Miao ^b   Liu, Beiye ^c  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b POLYTECHNIC UNIVERSITY   (United States)

^c UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

memristor; neural network; pattern recognition; process variation

Indexed keywords

GEOMETRY VARIATIONS; MEMRISTOR; MONTE CARLO SIMULATION; NANO SCALE; NEUROMORPHIC COMPUTING; PROCESS VARIATION; SIMPLE ALGORITHM; THREE-DIMENSIONAL DEVICES; TIO;

COMPUTER AIDED DESIGN; ELECTRIC PROPERTIES; INTELLIGENT SYSTEMS; MEMRISTORS; NEURAL NETWORKS; PATTERN RECOGNITION; RESISTORS; THREE DIMENSIONAL COMPUTER GRAPHICS; TITANIUM DIOXIDE;

PASSIVE FILTERS;

EID: 84863543355     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2228360.2228466     Document Type: Conference Paper

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