Growth, structure, and thermal conductivity of yttria-stabilized hafnia thin films

ACS Applied Materials and Interfaces

Volumn 4, Issue 1, 2012, Pages 200-204

  Ramana, C V ^a   Noor A Alam, M ^a   Gengler, Jamie J ^b,c   Jones, John G ^c  

^a University of Texas at El Paso   (United States)

^b 5100 Springfield St Suite 301   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

growth; structure; thermal conductivity; thin films; time domain thermoreflectance; yttria stabilized hafnia

Indexed keywords

AVERAGE GRAIN SIZE; CRITICAL TEMPERATURES; CUBIC PHASE; EFFECTIVE THERMAL CONDUCTIVITY; GRAIN SIZE; MONOCLINIC HFO; NANOCRYSTALLINES; ROOM TEMPERATURE; STRUCTURAL STUDIES; THERMALLY ACTIVATED PROCESS; TIME DOMAIN THERMOREFLECTANCE; YTTRIA-STABILIZED HAFNIA;

DEPOSITION; GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); HAFNIUM OXIDES; STRUCTURE (COMPOSITION); THERMAL CONDUCTIVITY; THIN FILMS; TIME DOMAIN ANALYSIS; VAPOR DEPOSITION; YTTRIUM ALLOYS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 84863393318     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am2012596     Document Type: Article

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