Development and characterization of Au-YSZ surface plasmon resonance based sensing materials: High temperature detection of CO

Journal of Physical Chemistry B

Volumn 110, Issue 27, 2006, Pages 13508-13511

  Sirinakis, George ^a   Siddique, Rezina ^a   Manning, Ian ^a   Rogers, Phillip H ^a   Carpenter, Michael A ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MONOXIDE; CHARACTERIZATION; CHARGE TRANSFER; NANOSTRUCTURED MATERIALS; OXIDATION; THIN FILMS;

ABSORPTION BAND; CARRIER GAS; CHARGE INJECTION; CONDUCTION PROPERTIES;

SURFACE PLASMON RESONANCE;

EID: 33746341193     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp062760n     Document Type: Article

References (27)

1. Göpel, W.; Reinhardt, G.; Rösch, M. Solid State Ionics 2000, 136, 519.
2. Fleischer, M.; Meixner, H. J. Vac. Sci. Technol. A 1999, 174, 1866.
3. Park, C. O.; Akbar, S. A. J. Mater. Sci. 2003, 38, 4611.
4. Schalwig, J.; Müller, G.; Ambacher, O.; Stutzmann, M. Phys. Stat. Sol. (a) 2001, 185, 39.
5. Spetz, A. L.; Baranzahi, A.; Tobias, P.; Lundstörm, I. Phys. Stat. Sol. (a) 1997, 162, 493.
6. Docquier, N.; Candel, S. Prog. Energy Combust. Sci. 2002, 28, 107.
7. Sbervegliery, G. Gas Sensors; Kluwer Academic Publishers: Norwell, MA, 1992.
8. Kreibig, U.; Vollmer, M. Optical Properties of Metal Clusters; Springer: New York, 1995.
9. Ando, M.; Kobayashi, T.; Iijima, S.; Haruta, M. Sens. Actuators, B 2003, 96, 589.
10. Cullity, B. D.; Stock, S. R. Elements of X-ray Diffraction, 3rd ed.; Prentice-Hall: New York, 2001.
11. Haes, A. J.; Van Duyne, R. P. J. Am. Chem. Soc. 2002, 124, 10596.
12. MacFarland, A. D.; Van Duyne, R. P. Nano Lett. 2003, 3, 1057.
13. Mock, J. J.; Smith, D. R.; Schultz, S. Nano Lett. 2003, 3, 485.
14. Hövel, H.; Fritz, S.; Hilger, A.; Kreibig, U.; Vollmer, M. Phys. Rev. B 1993, 48, 18178.
15. Sirinakis, G.; Siddique, R.; Monokroussos, C.; Carpenter M. A.; Kaloyeros A. E. J. Mater. Res. 2005, 20, 2516.
16. Sirinakis, G.; Siddique, R.; Dunn, K. A.; Efstathiadis, H.; Carpenter, M. A.; Kaloyeros, A. E.; Sun, L. J. Mater. Res 2005, 20, 3320.
17. Nowotny, J.; Bak, T.; Nowotny M. K.; Sorrell, C. C. Adv. Appl. Ceram. 2005, 104, 147.
18. Nowotny, J.; Bak, T.; Nowotny M. K.; Sorrell, C. C. Adv. Appl. Ceram. 2005, 104, 154.
19. Hosoya, Y.; Suga, T.; Yanagawa, T.; Kurokawa, Y. J. Appl. Phys. 1997, 81, 1475.
20. Kreibig, V.; Genzel, L. Surf. Sci. 1985, 156, 678.
21. Linnert, T.; Mulvaney, P.; Henglein, A. J. Phys. Chem. 1993, 97, 679.
22. Haruta, M.; Daté, M. Appl. Catal. A 2001, 222, 427.
23. Haruta, M. Gold Bull. 2004, 37, 27.
24. Zhang, X.; Wang, H.; Xu, B. J. Phys. Chem. B. 2005, 109, 9678.
25. Guzman, J.; Carrettin, S.; Fierro-Gonzalez, J.; Hao, Y.; Gates, B.; Corma, A. Angew. Chem., Int. Ed. 2005, 44, 4778.
26. Hirakawa, T.; Kamat, P. V. J. Am. Chem. Soc. 2005, 127, 3928.
27. Oldfield, G.; Ung, T.; Mulvaney, P. Adv. Mater. 2000, 12, 1519.