Crystal structure, phase, and electrical conductivity of nanocrystalline W 0.95Ti 0.05O 3 thin films

ACS Applied Materials and Interfaces

Volumn 3, Issue 3, 2011, Pages 863-868

  Kalidindi, N R ^a   Manciu, F S ^b   Ramana, C V ^a  

^a Energy Systems Laboratory (ESL)   (United States)

^b UNIVERSITY OF TEXAS AT EL PASO   (United States)

Author keywords

H2S sensors; microstructure; phase transformations; Ti doping; WO3

Indexed keywords

CHEMICAL BONDINGS; CRYSTALLINE FILMS; EFFECT OF TEMPERATURE; ELECTRICAL CONDUCTIVITY; ENERGY DISPERSIVE X-RAY; GROWTH BEHAVIOR; H2S SENSORS; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; NANOCRYSTALLINES; PHASE TRANSFORMATION; PHASE TRANSFORMATIONS; ROOM TEMPERATURE; SEM; SEM IMAGING; SI(1 0 0); STRUCTURAL CHANGE; STRUCTURAL ORDERS; TETRAGONAL STRUCTURE; TI-DOPING; VIBRATIONAL MODES; WO3; XRD;

AMORPHOUS FILMS; CHEMICAL BONDS; ELECTRIC CONDUCTIVITY; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERMETALLICS; MICROSTRUCTURE; MORPHOLOGY; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; SENSORS; SILICON WAFERS; SURFACE MORPHOLOGY; TEMPERATURE; TUNGSTEN; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL STRUCTURE;

NANOMATERIAL; OXIDE; TUNGSTEN DERIVATIVE; TUNGSTEN TITANATE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; OXIDES; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTIES; TUNGSTEN COMPOUNDS;

EID: 79956040679     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am101209d     Document Type: Article

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