Anomalous stress-induced hump effects in amorphous indium gallium zinc oxide TFTs

Transactions on Electrical and Electronic Materials

Volumn 13, Issue 1, 2012, Pages 47-49

  Kim, Yu Mi ^a   Jeong, Kwang Seok ^a   Yun, Ho Jin ^a   Yang, Seung Dong ^a   Lee, Sang Youl ^a   Lee, Hi Deok ^a   Lee, Ga Won ^a  

^a Chungnam National University   (South Korea)

Author keywords

Anomalous hump; Bias stress; IGZO; NBS; PBS; Thin film transistor (TFT)

Indexed keywords

ANOMALOUS HUMP; BIAS STRESS; IGZO; NBS; PBS; THIN FILM TRANSISTOR (TFT);

THIN FILM TRANSISTORS;

EID: 84863267344     PISSN: 12297607     EISSN: 20927592     Source Type: Journal    
DOI: 10.4313/TEEM.2012.13.1.47     Document Type: Article

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