Studies on the degradation properties of the ZnO-based ceramic film varistors

Microelectronic Engineering

Volumn 85, Issue 2, 2008, Pages 371-374

  Jiang, S L ^a   Xie, T T ^a   Yu, H ^a   Huang, Y Q ^b   Zhang, H B ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b CHINA UNIVERSITY OF GEOSCIENCES   (China)

Author keywords

Degradation property; Varistor; ZnO based ceramic film

Indexed keywords

AGRICULTURAL PRODUCTS; CERAMIC MATERIALS; CRYSTAL GROWTH; CURRENT DENSITY; DEGRADATION; DESORPTION; GRAIN (AGRICULTURAL PRODUCT); GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; LEAKAGE CURRENTS; NONMETALS; OXYGEN; SEMICONDUCTING ZINC COMPOUNDS; SULFATE MINERALS; ZINC; ZINC ALLOYS; ZINC OXIDE; ZINC SULFIDE;

AC BIAS; CERAMIC FILMS; DC BIASING; DC FIELDS; DEPLETION LAYERS; INTERSTITIAL ZINC; LEAKAGE CURRENT DENSITIES; NON LINEARITY COEFFICIENT; NONLINEAR VOLTAGE; NONLINEARITY (INCLUDING BIFURCATION THEORY); OXYGEN DESORPTION; REVERSE SIDE; V(F) CURVES;

VARISTORS;

EID: 47049125245     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2007.07.011     Document Type: Article

References (8)

1. Eda K., Iga A., and Matsuoka M. Jpn. J. Appl. Phys. 18 (1979) 997
2. Gupta T.K. J. Am. Ceram. Soc. 73 (1990) 1817
3. Gupta T.K., Carlson W.G., and Hower P.L. J. Appl. Phys. 52 (1981) 4104
4. Hayashi M., Haba M., Hirano S., et al. J. Appl. Phys. 53 (1982) 5754
5. Chiang Y.M., Kingery W.D., and Levinson L.M. J. Appl. Phys. 53 (1982) 1765
6. Stucki F., Bruesch P., and Greuter F. Surf. Sci. 189 (1987) 294
7. Huang Y.Q., Liu M.D., Zeng Y.K., et al. Mater. Sci. Eng. B86 (2001) 232
8. Chen Z.X., Lin G.C., Fu G., et al. Sci. China (Ser.A) 41 (1998) 71