메뉴 건너뛰기




Volumn 52, Issue 3, 2008, Pages 462-466

New PMOS LTPS-TFT pixel for AMOLED to suppress the hysteresis effect on OLED current by employing a reset voltage driving

Author keywords

AMOLED; Hysteresis; TFT pixel

Indexed keywords

ELECTRIC CURRENTS; HYSTERESIS; MATRIX ALGEBRA; ORGANIC LIGHT EMITTING DIODES (OLED); POLYSILICON; THIN FILM TRANSISTORS; VOLTAGE CONTROL;

EID: 39149123183     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.10.030     Document Type: Article
Times cited : (19)

References (7)
  • 2
    • 34547356892 scopus 로고    scopus 로고
    • A new poly-Si TFT current-mirror pixel for active matrix organic light emitting diode
    • Lee J.H., Nam W.J., Kim B.K., Choi H.S., Ha Y.M., and Han M.K. A new poly-Si TFT current-mirror pixel for active matrix organic light emitting diode. IEEE Electr Dev Lett 27 (2006) 830-833
    • (2006) IEEE Electr Dev Lett , vol.27 , pp. 830-833
    • Lee, J.H.1    Nam, W.J.2    Kim, B.K.3    Choi, H.S.4    Ha, Y.M.5    Han, M.K.6
  • 3
    • 34547575198 scopus 로고    scopus 로고
    • Effect of deposition rate on the property of ZnO thin films deposited by pulsed laser deposition
    • Kim J.W., Kang H.S., and Lee S.Y. Effect of deposition rate on the property of ZnO thin films deposited by pulsed laser deposition. J Electr Eng Technol 1 (2006) 98-100
    • (2006) J Electr Eng Technol , vol.1 , pp. 98-100
    • Kim, J.W.1    Kang, H.S.2    Lee, S.Y.3
  • 4
    • 33645688221 scopus 로고    scopus 로고
    • High-aperture pixel design employing VDD line elimination for active matrix organic light emitting diode display
    • Nam W.J., Lee J.H., Kim C.Y., Lee H.J., and Han M.K. High-aperture pixel design employing VDD line elimination for active matrix organic light emitting diode display. Jpn J Appl Phys 45 (2006) 2433-2436
    • (2006) Jpn J Appl Phys , vol.45 , pp. 2433-2436
    • Nam, W.J.1    Lee, J.H.2    Kim, C.Y.3    Lee, H.J.4    Han, M.K.5
  • 5
    • 2942618963 scopus 로고    scopus 로고
    • Recoverable residual image induced by hysteresis of thin film transistors in active matrix organic light emitting diode displays
    • Kim B.K., Kim O., Chung H.J., Chang J.W., and Ha Y.M. Recoverable residual image induced by hysteresis of thin film transistors in active matrix organic light emitting diode displays. Jpn J Appl Phys 43 (2004) 482-485
    • (2004) Jpn J Appl Phys , vol.43 , pp. 482-485
    • Kim, B.K.1    Kim, O.2    Chung, H.J.3    Chang, J.W.4    Ha, Y.M.5
  • 6
    • 0038908626 scopus 로고
    • Effect of NH3 plasma treatment of gate nitride on the performance of amorphous silicon thin-film transistors
    • Luan S., and Neudeck G.W. Effect of NH3 plasma treatment of gate nitride on the performance of amorphous silicon thin-film transistors. J Appl Phys 68 (1990) 3445-3450
    • (1990) J Appl Phys , vol.68 , pp. 3445-3450
    • Luan, S.1    Neudeck, G.W.2
  • 7
    • 33846976704 scopus 로고    scopus 로고
    • Suppression of OLED current error caused by the hysteresis of a-Si:H TFT for AMOLED display
    • Lee J.H., Park S.G., Jeon J.H., Goh J.C., Chung K.H., and Han M.K. Suppression of OLED current error caused by the hysteresis of a-Si:H TFT for AMOLED display. ECS Trans 3 (2006) 287-292
    • (2006) ECS Trans , vol.3 , pp. 287-292
    • Lee, J.H.1    Park, S.G.2    Jeon, J.H.3    Goh, J.C.4    Chung, K.H.5    Han, M.K.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.