The structural, optical and electrical properties of Y-doped SnO thin films and their p-type TFT application

Journal of Physics D: Applied Physics

Volumn 45, Issue 8, 2012, Pages

  Liang, Ling Yan ^a   Liu, Zhi Min ^a   Cao, Hong Tao ^a   Xu, Wang Ying ^a   Sun, Xi Lian ^a   Luo, Hao ^a   Cang, Kai ^a  

^a NINGBO INSTITUTE OF MATERIALS TECHNOLOGY AND ENGINEERING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITIES; FIELD-EFFECT MOBILITIES; GRAIN ORIENTATION; HALL EFFECT MEASUREMENT; ON/OFF CURRENT RATIO; OPTICAL AND ELECTRICAL PROPERTIES; P-TYPE; REAL PART; UNDOPED FILMS; Y-DOPED; Y-DOPING;

ELECTRIC PROPERTIES; SEMICONDUCTOR DOPING; SPECTROSCOPIC ELLIPSOMETRY; THIN FILM TRANSISTORS; THIN FILMS; X RAY DIFFRACTION; YTTRIUM;

YTTRIUM ALLOYS;

EID: 84863138258     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/45/8/085101     Document Type: Article

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