Design of optimum simple step-stress accelerated life testing plans

Recent Advances in Stochastic Operations Research

Volumn , Issue , 2007, Pages 23-38

  Elsayed, Elsayed A ^a   Zhang, Hao ^a  

^a RUTGERS UNIVERSITY   (United States)

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EID: 79956373691     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1142/9789812706683_0002     Document Type: Chapter

References (17)

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