Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring

Applied Mathematical Modelling

Volumn 34, Issue 10, 2010, Pages 3166-3178

  Srivastava, Preeti Wanti ^a   Mittal, Neha ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

Acceleration factor; Asymptotic variance; Partially accelerated life test; Reliability; Step stress test

Indexed keywords

ACCELERATED LIFE TESTS; ACCELERATION FACTORS; ASYMPTOTIC VARIANCE; FAILURE RATE; HAZARD RATES; LIFE DISTRIBUTION; LIFETIME DATA; LOG-NORMAL; LOGISTIC DISTRIBUTIONS; MAXIMUM LIKELIHOOD ESTIMATE; MODEL PARAMETERS; SAMPLE SELECTION; SAMPLE SPACE; STEP-STRESS; SUB-REGIONS; TRUNCATED DISTRIBUTIONS; WEIBULL;

ACCELERATION; ASYMPTOTIC ANALYSIS; MAXIMUM LIKELIHOOD ESTIMATION; OPTIMIZATION; RELIABILITY; SENSITIVITY ANALYSIS; STRESS ANALYSIS; VARIATIONAL TECHNIQUES; WEIBULL DISTRIBUTION;

TESTING;

EID: 77952884091     PISSN: 0307904X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apm.2010.02.007     Document Type: Article

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