Nonparametric Model for Step-Stress Accelerated Life Testing

IEEE Transactions on Reliability

Volumn 45, Issue 2, 1996, Pages 346-350

  Tyoskin, Oleg I ^a   Krivolapov, Sergey Y ^a  

^a BAUMAN MOSCOW STATE TECHNICAL UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFE TEST; CUMULATIVE DAMAGE MODEL; INCREASING FAILURE RATE; STEP STRESS; TIME TRANSFORMATION;

FAILURE (MECHANICAL); MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBABILITY; RELIABILITY; STATISTICAL METHODS; STATISTICS; STRESSES;

MECHANICAL TESTING;

EID: 0030165711     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.510824     Document Type: Article

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