Analysis of step-stress accelerated-life-test data: a new approach

IEEE Transactions on Reliability

Volumn 45, Issue 1, 1996, Pages 69-74

  Tang, L C ^a,b   Sun, Y S ^a,b   Goh, T N ^a,b   Ong, H L ^a,b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Silicon Systems (Singapore)   (Singapore)

Author keywords

Accelerated life test; Cumulative exposure model; Maximum likelihood estimator (mle); Step stress; Weibull distribution

Indexed keywords

MATHEMATICAL MODELS; PARAMETER ESTIMATION; SERVICE LIFE; STRESS ANALYSIS; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TEST; CUMULATIVE EXPOSURE MODEL; MAXIMUM LIKELIHOOD ESTIMATOR; STEP STRESS;

FAILURE ANALYSIS;

EID: 0030105468     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.488919     Document Type: Article

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