Comparison between constant and step-stress tests for Weibull models

International Journal of Quality and Reliability Management

Volumn 14, Issue 1, 1997, Pages 74-81

  Khamis, Imad H ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

Product lifecycle; Statistical process control; Tests

Indexed keywords

EID: 0005620479     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719710156798     Document Type: Article

References (7)

1. Nelson, W., Accelerated Testing: Statistical Models, Test Plans, and Data Analyses.
2. Kielpinski, T.J., Nelson, W., "Optimum censored accelerated life tests for normal and lognormal life distribution", IEEE Trans. Reliability.
3. Nelson, W., "Accelerated life testing-step-stress models and data analyses", IEEE Trans. Reliability.
4. Bai, D.S., Kim, M.S., Lee, S.H. (1989), "Optimum simple step-stress accelerated life tests with censoring" in IEEE Trans. Reliability, Vol. 38, pp. 528-32.
5. Miller, R., Nelson, W., "Optimum simple step-stress plans for accelerated life testing", IEEE Trans. Reliability.
6. Khamis, I.H., Higgins, J.J. (1996), "Optimum 3-step step-stress tests" in IEEE Trans. Reliability, Vol. 45, pp. 341-5.
7. Khamis, I.H., Higgins, J.J. (1996), "An alternative to the Weibull step-stress model", Joint Statistical Meetings, Chicago, August.