-
2
-
-
0024891878
-
Optimum simple step-stress accelerated life test with censoring
-
D. S. Bai, M. S. Kim, and S. H. Lee, "Optimum simple step-stress accelerated life test with censoring," IEEE Trans. Reliability, vol. 38, pp. 528-532, 1989.
-
(1989)
IEEE Trans. Reliability
, vol.38
, pp. 528-532
-
-
Bai, D.S.1
Kim, M.S.2
Lee, S.H.3
-
3
-
-
33847735552
-
Point and interval estimation for a simple step-stress model with Type-II censoring
-
N. Balakrishnan, D. Kundu, H. K. T. Ng, and N. Kannan, "Point and interval estimation for a simple step-stress model with Type-II censoring," Journal of Quality Technology, vol. 39, pp. 35-47, 2007.
-
(2007)
Journal of Quality Technology
, vol.39
, pp. 35-47
-
-
Balakrishnan, N.1
Kundu, D.2
Ng, H.K.T.3
Kannan, N.4
-
4
-
-
34247560738
-
Exact inference for a simple step-stress model with Type-II hybrid censored data from the exponential distribution
-
N. Balakrishnan and Q. Xie, "Exact inference for a simple step-stress model with Type-II hybrid censored data from the exponential distribution," Journal of Statistical Planning and Inference, vol. 137, pp. 2543-2563, 2007.
-
(2007)
Journal of Statistical Planning and Inference
, vol.137
, pp. 2543-2563
-
-
Balakrishnan, N.1
Xie, Q.2
-
5
-
-
34447505961
-
Exact inference for a simple step-stress model with Type-I hybrid censored data from the exponential distribution
-
N. Balakrishnan and Q. Xie, "Exact inference for a simple step-stress model with Type-I hybrid censored data from the exponential distribution," Journal of Statistical Planning and Inference, vol. 137, pp. 3268-3290, 2007.
-
(2007)
Journal of Statistical Planning and Inference
, vol.137
, pp. 3268-3290
-
-
Balakrishnan, N.1
Xie, Q.2
-
6
-
-
59549095935
-
Exact inference for a simple step stress model from the exponential distribution under time constraint
-
to appear
-
N. Balakrishnan, Q. Xie, and D. Kundu, "Exact inference for a simple step stress model from the exponential distribution under time constraint," Annals of the Institute of Statistical Mathematics, 2008, (to appear).
-
(2008)
Annals of the Institute of Statistical Mathematics
-
-
Balakrishnan, N.1
Xie, Q.2
Kundu, D.3
-
9
-
-
0001402509
-
The asymptotics of maximum likelihood and related estimators based on Type-II censored data
-
G. K. Bhattacharyya, "The asymptotics of maximum likelihood and related estimators based on Type-II censored data," Journal of the American Statistical Association, vol. 80, pp. 398-404, 1985.
-
(1985)
Journal of the American Statistical Association
, vol.80
, pp. 398-404
-
-
Bhattacharyya, G.K.1
-
11
-
-
0000714520
-
Bayesian estimation and optimal design in partially accelerated life testing
-
M. H. DeGroot and P. K. Goel, "Bayesian estimation and optimal design in partially accelerated life testing," Naval Research Logistics Quarterly, vol. 26, pp. 223-235, 1979.
-
(1979)
Naval Research Logistics Quarterly
, vol.26
, pp. 223-235
-
-
DeGroot, M.H.1
Goel, P.K.2
-
12
-
-
4544221454
-
Step-stress accelerated life tests
-
N. Balakrishnan and C. R. Rao, Eds. Amsterdam: Elsevier
-
E. Gouno and N. Balakrishnan, "Step-stress accelerated life tests," in Advances in Reliability: Handbook of Statistics, N. Balakrishnan and C. R. Rao, Eds. Amsterdam: Elsevier, 2001, vol. 20, pp. 623-639.
-
(2001)
Advances in Reliability: Handbook of Statistics
, vol.20
, pp. 623-639
-
-
Gouno, E.1
Balakrishnan, N.2
-
13
-
-
4444220957
-
A parametric model for studying organism fitness using step-stress experiments
-
S. Greven, A. J. Bailer, L. L. Kupper, K. E. Muller, and J. L. Craft, "A parametric model for studying organism fitness using step-stress experiments," Biometrics, vol. 60, pp. 793-799, 2004.
-
(2004)
Biometrics
, vol.60
, pp. 793-799
-
-
Greven, S.1
Bailer, A.J.2
Kupper, L.L.3
Muller, K.E.4
Craft, J.L.5
-
14
-
-
57749115681
-
Inference for a simple step-stress model with Type-II censoring and Weibull distributed lifetimes
-
to appear
-
M. Kateri and N. Balakrishnan, "Inference for a simple step-stress model with Type-II censoring and Weibull distributed lifetimes," IEEE Trans. Reliability, 2008, (to appear).
-
(2008)
IEEE Trans. Reliability
-
-
Kateri, M.1
Balakrishnan, N.2
-
15
-
-
0032083940
-
A new model for step-stress testing
-
I. H. Khamis and J. J. Higgins, "A new model for step-stress testing," IEEE Trans. Reliability, vol. 47, pp. 131-134, 1998.
-
(1998)
IEEE Trans. Reliability
, vol.47
, pp. 131-134
-
-
Khamis, I.H.1
Higgins, J.J.2
-
17
-
-
84896838005
-
Multiple step-stress accelerated life test: The tampered failure rate model
-
M. T. Madi, "Multiple step-stress accelerated life test: The tampered failure rate model," Communications in Statistics - Theory & Methods vol. 22, pp. 2631-2639, 1993.
-
(1993)
Communications in Statistics - Theory & Methods
, vol.22
, pp. 2631-2639
-
-
Madi, M.T.1
-
19
-
-
0020734526
-
Optimum simple step-stress plans for accelerated life testing
-
R. Miller and W. B. Nelson, "Optimum simple step-stress plans for accelerated life testing," IEEE Trans. Reliability, vol. R-32, pp. 59-65, 1983.
-
(1983)
IEEE Trans. Reliability
, vol.R-32
, pp. 59-65
-
-
Miller, R.1
Nelson, W.B.2
-
20
-
-
0019026625
-
Accelerated life testing: Step-stress models and data analysis
-
W. B. Nelson, "Accelerated life testing: Step-stress models and data analysis," IEEE Trans. Reliability, vol. 29, pp. 103-108, 1980.
-
(1980)
IEEE Trans. Reliability
, vol.29
, pp. 103-108
-
-
Nelson, W.B.1
-
23
-
-
0003116575
-
On the physical principle in reliability theory, (in Russian)
-
N. M. Sedyakin, "On the physical principle in reliability theory," (in Russian) Techn. Cybernetics, vol. 3, pp. 80-87, 1966.
-
(1966)
Techn. Cybernetics
, vol.3
, pp. 80-87
-
-
Sedyakin, N.M.1
-
25
-
-
0036599708
-
A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests
-
S. L. Teng and K. P. Yeo, "A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests," IEEE Trans. Reliability, vol. 51, pp. 177-182, 2002.
-
(2002)
IEEE Trans. Reliability
, vol.51
, pp. 177-182
-
-
Teng, S.L.1
Yeo, K.P.2
-
27
-
-
0242404307
-
A general Bayes exponential inference model for accelerated life testing
-
J. R. Van Dorp and T. A. Mazzuchi, "A general Bayes exponential inference model for accelerated life testing," Journal of Statistical Planning and Inference, vol. 119, pp. 55-74, 2002.
-
(2002)
Journal of Statistical Planning and Inference
, vol.119
, pp. 55-74
-
-
Van Dorp, J.R.1
Mazzuchi, T.A.2
-
28
-
-
0035265698
-
Commentary: Inference in simple step-stress models
-
A. J. Watkins, "Commentary: Inference in simple step-stress models," IEEE Trans. Reliability, vol. 50, pp. 36-37, 2001.
-
(2001)
IEEE Trans. Reliability
, vol.50
, pp. 36-37
-
-
Watkins, A.J.1
-
29
-
-
0032083911
-
Inferences on a simple step-stress model with Type-II censored exponential data
-
C. Xiong, "Inferences on a simple step-stress model with Type-II censored exponential data," IEEE Trans. Reliability, vol. 47, pp. 142-146, 1998.
-
(1998)
IEEE Trans. Reliability
, vol.47
, pp. 142-146
-
-
Xiong, C.1
-
30
-
-
0032684450
-
Step-stress life-testing with random stress-change times for exponential data
-
C. Xiong and G. A. Milliken, "Step-stress life-testing with random stress-change times for exponential data," IEEE Trans. Reliability vol. 48, pp. 141-148, 1999.
-
(1999)
IEEE Trans. Reliability
, vol.48
, pp. 141-148
-
-
Xiong, C.1
Milliken, G.A.2
|