Automated near-field scanning algorithm for the EMC analysis of electronic devices

IEEE Transactions on Electromagnetic Compatibility

Volumn 54, Issue 3, 2012, Pages 502-510

  Deschrijver, Dirk ^a   Vanhee, Filip ^b,c   Pissoort, Davy ^b,c   Dhaene, Tom ^a  

^a GHENT UNIVERSITY   (Belgium)

^b Katholieke Hogeschool Brugge Oostende   (Belgium)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Electromagnetic compatibility (EMC); Kriging; near field (NF) scanning; sequential sampling; surrogate modeling

Indexed keywords

AUTOMATED PROCEDURES; ELECTRONIC DEVICE; ELECTRONIC SYSTEMS; KRIGING; NEAR-FIELD; NEAR-FIELD SCAN; NEAR-FIELD SCANNING; OPTIMAL COORDINATE; SEQUENTIAL SAMPLING; SURROGATE MODELING;

ELECTROMAGNETIC COMPATIBILITY;

MULTIMODE FIBERS;

EID: 84862588880     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2011.2163821     Document Type: Article

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