Applications of the near-field techniques in EMC investigations

IEEE Transactions on Electromagnetic Compatibility

Volumn 49, Issue 3, 2007, Pages 485-493

  Baudry, David ^a,b   Arcambal, Christian ^a,b   Louis, Anne ^a,b   Mazari, Bélahcène ^a,b   Eudeline, Philippe ^c  

^a ESIGELEC   (France)

^b Rouen   (France)

^c THALES   (France)

Author keywords

Component; Electric field; Electromgnetic compatibility (EMC); Magnetic field; Near field measurement; Probe

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC FIELDS; EMBEDDED SYSTEMS; MAGNETIC FIELDS; PROBES;

3-D POSITIONING SYSTEMS; ACCURATE MEASUREMENT; COMPONENT; ELECTROMAGNETIC SOURCES; ELECTROMGNETIC COMPATIBILITY (EMC); NEAR-FIELD MAPPING SYSTEMS; NEAR-FIELD MEASUREMENT; RESEARCH INSTITUTES;

ELECTROMAGNETIC COMPATIBILITY;

EID: 57649164837     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2007.902194     Document Type: Article

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