Probe characterization for electromagnetic near-field studies

IEEE Transactions on Instrumentation and Measurement

Volumn 59, Issue 2, 2010, Pages 292-300

  Jarrix, Sylvie ^a   Dubois, Tristan ^a   Adam, Ronan ^a   Nouvel, Philippe ^a   Azais, Bruno ^b   Gasquet, Daniel ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b CENTRE D ETUDES DE GRAMAT   (France)

Author keywords

Electric field; Electromagnetic (EM) analysis; Magnetic field; Probe antennas; Reflection; Simulation

Indexed keywords

CONTACT LESS; ELECTRIC AND MAGNETIC FIELDS; ELECTROMAGNETIC ANALYSIS; FIELD CAPTURE; MAGNETIC FIELD PROBE; NEAR-FIELD; NEAR-FIELD MEASUREMENT; OPTIMAL SIZE; PROBE ANTENNAS; PROBE STRUCTURES; SPACE RESOLUTIONS;

ANTENNAS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELDS; MAGNETIC FIELDS; PROBES;

MAGNETIC MATERIALS;

EID: 76149095619     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2023148     Document Type: Article

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