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1
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70549111142
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Modeling IC snapback characteristics under electrostatic discharge Stress
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Nov
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A. Ramanujan, M. Kadi, J. Trémenbert, F. Lafon, and B. Mazari, "Modeling IC snapback characteristics under electrostatic discharge Stress", IEEE Trans. Electromagn. Compat., vol. 51, no. 4, pp. 901-908, Nov. 2009.
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IEEE Trans. Electromagn. Compat.
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Ramanujan, A.1
Kadi, M.2
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Lafon, F.4
Mazari, B.5
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2
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40949133830
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Modeling the electromagnetic emission of a microcontroller using a single model
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Feb
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C. Labussière-Dorgan, S. Bendhia, E. Sicard, J. Tao, H. J. Quaresma, C. Lochot, and B. Virgnon, "Modeling the electromagnetic emission of a microcontroller using a single model", IEEE Trans. Electromagn. Compat., vol. 50, no. 1, pp. 22-34, Feb. 2008.
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IEEE Trans. Electromagn. Compat.
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Labussière-Dorgan, C.1
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Quaresma, H.J.5
Lochot, C.6
Virgnon, B.7
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3
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0035519088
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A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization
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Nov
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J. R. Regué, M. Ribó, J. M. Garrell, and A. Martin, "A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization", IEEE Trans. Electromagn. Compat., vol. 43, no. 4, pp. 520-530, Nov. 2001.
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IEEE Trans. Electromagn. Compat.
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Regué, J.R.1
Ribó, M.2
Garrell, J.M.3
Martin, A.4
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4
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58149272321
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Modeling electromagnetic emission of integrated eircuits for system analysis
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presented at, Munich, Germany
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P. Kralicek, W. John, and H. Garbe, "Modeling electromagnetic emission of integrated eircuits for system analysis", presented at the Conf. Exhib. Des. Autom. Test Eur., Munich, Germany, 2001.
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The Conf. Exhib. Des. Autom. Test Eur.
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Kralicek, P.1
John, W.2
Garbe, H.3
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5
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33746650554
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On the prediction of near-field microcontroller emissions
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presented at, Chicago, IL, Aug
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E. Sicard, A. Boyer, and A. Tankielun, "On the prediction of near-field microcontroller emissions", presented at the IEEE Int. Symp. Electromagn. Compat. (EMC), Chicago, IL, Aug. 2005.
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(2005)
The IEEE Int. Symp. Electromagn. Compat. (EMC)
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Sicard, E.1
Boyer, A.2
Tankielun, A.3
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6
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4644310472
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Using near-field scanning to predict radiated fields
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Aug
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J. Shi, M. A. Cracraft, J. Zhang, R. E. DuBroff, and K. Slattery, "Using near-field scanning to predict radiated fields", in Proc. Int. Symp. Electromagn. Compat. (EMC), vol. 1, pp. 14-18, Aug. 2004.
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Proc. Int. Symp. Electromagn. Compat. (EMC)
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Shi, J.1
Cracraft, M.A.2
Zhang, J.3
DuBroff, R.E.4
Slattery, K.5
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7
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36749015584
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Estimation of highfrequency currents from near-field scan measurements
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Nov
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H. Weng, D. G. Beetner, R. E. DuBroff, and J. Shi, "Estimation of highfrequency currents from near-field scan measurements", IEEE Trans. Electromagn. Compat., vol 49, no. 4, pp. 805-815, Nov. 2007.
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IEEE Trans. Electromagn. Compat.
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Weng, H.1
Beetner, D.G.2
DuBroff, R.E.3
Shi, J.4
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8
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78649298288
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Near field microcontroller model for PCB radiated field prediction
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presented at, Barcelona, Spain, Jun
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F. de Daran, F. Lafon, and O. Maurice, "Near field microcontroller model for PCB radiated field prediction", presented at the Int. Conf. Electromagn. Near-Field Charac. Imag. (ICONIC), Barcelona, Spain, Jun. 2005.
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(2005)
The Int. Conf. Electromagn. Near-Field Charac. Imag. (ICONIC)
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De Daran, F.1
Lafon, F.2
Maurice, O.3
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9
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34347387965
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Modeling magnetic radiations of electronic circuits using near-field scanning method
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May
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Y. Vives-Gilabert, C. Arcambal, A. Louis, F. de Daran, P. Eudeline, and B. Mazari, "Modeling magnetic radiations of electronic circuits using near-field scanning method", IEEE Trans. Electromagn. Compat., vol. 49, no. 2, pp. 391-400, May 2007.
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IEEE Trans. Electromagn. Compat.
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Vives-Gilabert, Y.1
Arcambal, C.2
Louis, A.3
De Daran, F.4
Eudeline, P.5
Mazari, B.6
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10
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64249095586
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A radiated emission model compatible to a commercial electromagnetic simulation tool
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presented at, Zurich, Switzerland, Jan
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P. Fernandez, A. Ramanujan, Y. Vives, C. Arcambal, A. Louis, and B. Mazari, "A radiated emission model compatible to a commercial electromagnetic simulation tool", presented at the 20th Int. Symp. Electromagn. Compat. (EMC), Zurich, Switzerland, Jan. 2009.
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(2009)
The 20th Int. Symp. Electromagn. Compat. (EMC)
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Fernandez, P.1
Ramanujan, A.2
Vives, Y.3
Arcambal, C.4
Louis, A.5
Mazari, B.6
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11
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72149106195
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Development of a magnetic field model and insertion into a commercial electromagnetic simulator
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P. Fernandez, C. Arcambal, Y. Vives, A. Ramanujan, D. Baudry, A. Louis, and B. Mazari, "Development of a magnetic field model and insertion into a commercial electromagnetic simulator", Turk. J. Electron. Eng. Comput. Sci., vol. 17, no. 3, pp. 289-300, 2009.
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Turk. J. Electron. Eng. Comput. Sci.
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Fernandez, P.1
Arcambal, C.2
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Ramanujan, A.4
Baudry, D.5
Louis, A.6
Mazari, B.7
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12
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78649294094
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Near-field measurements to create a model suitable for a commercial simulation tool
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Taipei, Taiwan, Jun
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P. Fernandez, C. Arcambal, S. Verdeyme, D. Baudry, and B. Mazari, "Near-field measurements to create a model suitable for a commercial simulation tool", in Proc. 4th Int. Conf. Electromagn. Near-Field Charac. Imag. (ICONIC), Taipei, Taiwan, Jun. 2009, pp. 208-213.
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(2009)
Proc. 4th Int. Conf. Electromagn. Near-Field Charac. Imag. (ICONIC)
, pp. 208-213
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Fernandez, P.1
Arcambal, C.2
Verdeyme, S.3
Baudry, D.4
Mazari, B.5
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13
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78649255476
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Ph. D. dissertation, Univ. Rouen, Rouen, France, Nov
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Y. Vives-Gilabert, "Modeling radiated emissions of electronic components", Ph. D. dissertation, Univ. Rouen, Rouen, France, Nov. 2007.
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(2007)
Modeling Radiated Emissions of Electronic Components
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Vives-Gilabert, Y.1
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14
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84947145047
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A generalized inverse for matrices.
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Proc. Cambridge Phil. Soc.
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Penrose, R.1
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16
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0000169232
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An algorithm for least-squares estimation of nonlinear parameters
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SIAM J. Appl. Math.
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Marquardt, D.1
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Ph. D Dissertation, Univ. Rouen, Rouen, France, Apr
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D. Baudry, "Conception, validation et exploitation d'un dispositif de mesure de champs électromagnétiques proches: Application CEM", Ph. D Dissertation, Univ. Rouen, Rouen, France, Apr. 2005.
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(2005)
Conception, Validation et Exploitation D'un Dispositif de Mesure de Champs Électromagnétiques Proches: Application CEM
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Baudry, D.1
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18
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42449094249
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Characterization of electromagnetic fields close to microwave devices using electric dipole probes
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Mar
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L. Bouchelouk, Z. Riah, D. Baudry, M. Kadi, A. Louis, and B. Mazari, "Characterization of electromagnetic fields close to microwave devices using electric dipole probes", Int. J. RF Microw. Comput.-Aided Eng., vol. 18, pp. 146-156, Mar. 2008.
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Int. J. RF Microw. Comput.-Aided Eng.
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Bouchelouk, L.1
Riah, Z.2
Baudry, D.3
Kadi, M.4
Louis, A.5
Mazari, B.6
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