Calibration of electric probes for post-processing of near-field scanning data

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2006, Pages 119-124

  Tankielun, Adam ^a   Garbe, Heyno ^b   John, Werner ^c  

^a UNIVERSITY OF PADERBORN   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^c FRAUNHOFER INSTITUTE FOR ELECTRONIC NANO SYSTEMS ENAS   (Germany)

Author keywords

Calibration; Compensation; Deconvolution; Near field scanning; Nearfield probes; Resolution enhancement

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; DATA PROCESSING; DECONVOLUTION; ELECTRIC POWER DISTRIBUTION; ELECTROMAGNETIC FIELDS;

COMPENSATION; NEAR FIELD SCANNING; NEARFIELD PROBES; RESOLUTION ENHANCEMENT;

PROBES;

EID: 34047214122     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/isemc.2006.1706276     Document Type: Conference Paper

References (8)

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