Postprocessing of near-field measurement based on neural networks

IEEE Transactions on Instrumentation and Measurement

Volumn 60, Issue 2, 2011, Pages 539-546

  Brahimi, Ryadh ^a   Kornaga, Adam ^b   Bensetti, Mohamed ^c   Baudry, David ^c   Riah, Zouheir ^c   Louis, Anne ^c   Mazari, Belahcene ^c  

^a Europe Africa Manufacturing   (Algeria)

^b Huisman   (Netherlands)

^c ESIGELEC   (France)

Author keywords

Electromagnetic compatibility (EMC); magnetic field measurement; multilayer perceptrons (MLPs); near field test bench; neural networks (NNs); power electronics; probe

Indexed keywords

DIFFERENT FREQUENCY; ELECTROMAGNETIC COMPATIBILITY MEASUREMENTS; ELECTRONICS COMPONENTS; GRAPHIC INTERFACES; MAGNETIC NEAR FIELD; MEASUREMENT RESULTS; MULTI LAYER PERCEPTRON; MULTILAYER PERCEPTRONS (MLPS); NEAR-FIELD; NEAR-FIELD MEASUREMENT; NEURAL NETWORK MODEL; OPTIMIZATION METHOD; PASSIVE DEVICES; SPATIAL RESOLUTION; SPLIT-SAMPLE;

CYBERNETICS; ELECTRIC LOADS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETISM; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; MAGNETIC MATERIALS; MULTILAYERS; PATTERN RECOGNITION SYSTEMS; POWER ELECTRONICS; PROBES;

MULTILAYER NEURAL NETWORKS;

EID: 78651306435     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2010.2050373     Document Type: Article

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