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Volumn 60, Issue , 2006, Pages 311-333

Characterization of the open-ended coaxial probe used for near-field measurements in EMC applications

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Indexed keywords


EID: 33947097839     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER05112501     Document Type: Article
Times cited : (80)

References (13)
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  • 2
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    • Ostermann, T.1    Deutschmann, B.2
  • 3
    • 20444495166 scopus 로고    scopus 로고
    • Influence of core optimisation and activity for electromagnetic near-field and conducted emissions of CESAME test chip
    • Angers, France, April
    • Tankielun, A., P. Kralicek, U. Keller, E. Sicard, and B. Vrignon, "Influence of core optimisation and activity for electromagnetic near-field and conducted emissions of CESAME test chip," EMC Compo 2004 conference, 95-100, Angers, France, April 2004.
    • (2004) EMC Compo 2004 conference , pp. 95-100
    • Tankielun, A.1    Kralicek, P.2    Keller, U.3    Sicard, E.4    Vrignon, B.5
  • 4
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    • Angers, France, April
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  • 6
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    • A study and improvement of open-ended coaxial probe used for near-field measurements
    • Zurich, Switzerland, February
    • Baudry, D., A. Louis, and B. Mazari, "A study and improvement of open-ended coaxial probe used for near-field measurements," EMC Zurich Conference, Zurich, Switzerland, February 2005.
    • (2005) EMC Zurich Conference
    • Baudry, D.1    Louis, A.2    Mazari, B.3
  • 7
    • 0030704905 scopus 로고
    • Measurements of fields distributions and scattering parameters in multiconductor structures using an electric field probe
    • Denver, USA, 1997
    • Gao, Y. and I. Wolff, "Measurements of fields distributions and scattering parameters in multiconductor structures using an electric field probe," IEEE MTT-S Int. Microw. Symp. Digest, 1741-1744, Denver, USA, 1997.
    • (1741) IEEE MTT-S Int. Microw. Symp. Digest
    • Gao, Y.1    Wolff, I.2
  • 9
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    • Adjacent electric field and magnetic field distribution
    • Minneapolis, USA
    • Kazama, S. and K. I. Arai, "Adjacent electric field and magnetic field distribution," IEEE Int. Symp. on EMC, 395-400, Minneapolis, USA, 2002.
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    • Kazama, S.1    Arai, K.I.2
  • 10
    • 0035785498 scopus 로고    scopus 로고
    • Near-field imaging of radiated emission sources on printed-circuit boards
    • Montreal, Canada
    • Laurin, J. J., Z. Ouardhiri, and J. Colinas, "Near-field imaging of radiated emission sources on printed-circuit boards," IEEE Int. Symp. on EMC, 368-373, Montreal, Canada, 2001.
    • (2001) IEEE Int. Symp. on EMC , pp. 368-373
    • Laurin, J.J.1    Ouardhiri, Z.2    Colinas, J.3
  • 11
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    • Combes, P. F. and R. Crampagne, Circuits passifs hyperfréquences: guides d'ondes métalliques, E 1401, traité Electronique, Techniques de l'ingénieur, 2002.
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  • 12
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    • Electric probe measurements on microstrip
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    • Dahele, J.S.1    Cullen, A.L.2
  • 13
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    • France, Avril
    • Baudry, D., "Conception, validation et exploitation d'un dispositif de mesure de champs électromagnétiques proches. Application CEM," Thèse, Université de Rouen, France, Avril 2005.
    • (2005) Thèse, Université de Rouen
    • Baudry, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.