Prediction of radiated emissions using near-field measurements

IEEE Transactions on Electromagnetic Compatibility

Volumn 53, Issue 4, 2011, Pages 891-899

  Weng, Haixiao ^a   Beetner, Daryl G ^b   Dubroff, Richard E ^b  

^a TEXAS INSTRUMENTS   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

Electromagnetic interference; electromagnetic measurements; estimation; modeling; scattering

Indexed keywords

ELECTROMAGNETIC EMISSIONS; ELECTROMAGNETIC MEASUREMENT; ELECTRONIC PRODUCT; EQUIVALENT SOURCE; FINITE DIFFERENCE TIME DOMAINS; FULL-WAVE SIMULATIONS; MAGNETIC CURRENT SOURCES; MICROSTRIPES; NEAR-FIELD; NEAR-FIELD MEASUREMENT; NEAR-FIELD SCAN; NUMERICAL MODELING; RADIATED EMISSIONS; RADIATED FIELD;

ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROMAGNETISM; ESTIMATION; FINITE DIFFERENCE TIME DOMAIN METHOD; MODELS; SCATTERING; SIGNAL INTERFERENCE;

FORECASTING;

EID: 81955160861     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2011.2141998     Document Type: Article

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