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0032672349
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Near-field to near/far-field transformation for arbitrary near-field geometry utilizing an equivalent electrical current and MoM
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0030213685
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Near-field to near/far-field transformation for arbitrary near-field geometry, utilizing an equivalent magnetic current
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PII S0018937596038604
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1706371, 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
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A study of the probe induced disturbances on the near-field measurement
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Istanbul, Turkey
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J. Shi, R. E. DuBroff, K. Slattery, M. Yamaguchi, and K. Arai, "A study of the probe induced disturbances on the near-field measurement," in Proc. 2003 IEEE Int. Symp. Electromagn. Compat., Istanbul, Turkey, vol. 1, pp. 127-130.
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