Differential alternating current chip calorimeter for in situ investigation of vapor-deposited thin films

Review of Scientific Instruments

Volumn 83, Issue 3, 2012, Pages

  Ahrenberg, M ^a   Shoifet, E ^a   Whitaker, K R ^b   Huth, H ^a   Ediger, M D ^b   Schick, C ^a  

^a UNIVERSITY OF ROSTOCK   (Germany)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATING CURRENT; CHIP CALORIMETER; DYNAMIC GLASS TRANSITION; EXPERIMENTAL DATA; FINITE ELEMENT MODELING; FREQUENCY DEPENDENCE; HEAT CAPACITY MEASUREMENTS; IN-SITU; MATERIAL PROPERTY; MODEL FIT; NANOMETER THIN FILMS; ORGANIC GLASS; SAMPLE THICKNESS; TEMPERATURE CALIBRATION; VACUUM CHAMBERS;

CALORIMETERS; CALORIMETRY; ETHYLBENZENE; GLASS; GLASS TRANSITION; SENSORS; THIN FILMS; TOLUENE; VAPOR DEPOSITION;

VAPORS;

EID: 84861596618     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3692742     Document Type: Review

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