Nanocalorimetric high-temperature characterization of ultrathin films of a-Ge

Materials Science in Semiconductor Processing

Volumn 9, Issue 4-5 SPEC. ISS., 2006, Pages 806-811

  Lopeandia A F ^a   Leon Gutierrez, E ^a   Garcia, G ^a   Pi, F ^a   Bernardi, A ^b   Goni A R ^b   Alonso, M I ^b   Rodriguez Viejo J ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^b CSIC   (Spain)

Author keywords

Ge thin films; Melting; Nanocalorimetry

Indexed keywords

CRYSTALLIZATION; GERMANIUM; PHASE TRANSITIONS; THERMODYNAMICS;

HEATING RATES; HETEROGENEOUS NUCLEATION; NANOCALORIMETRIC MEASUREMENTS; TEMPERATURE RANGE;

ULTRATHIN FILMS;

EID: 33845209965     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2006.08.078     Document Type: Article

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