Vacuum ellipsometry as a method for probing glass transition in thin polymer films

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Efremov, Mikhail Yu ^a   Soofi, Shauheen S ^a   Kiyanova, Anna V ^a   Munoz, Claudio J ^a   Burgardt, Peter ^a   Cerrina, Franco ^a   Nealey, Paul F ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; GLASS TRANSITION; PHASE MODULATION; POLYMER FILMS; SPECTROSCOPIC ANALYSIS; TEMPERATURE DISTRIBUTION;

POLYSTYRENE FILMS; THIN POLYMER FILMS; VACUUM ELLIPSOMETRY; VARIABLE TEMPERATURE OPTICAL TABLE;

ELLIPSOMETRY;

EID: 42949099000     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2901601     Document Type: Article

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