Membrane-based calorimetry for studies of sub-microgram samples

Journal of Physics: Conference Series

Volumn 150, Issue 5, 2009, Pages

  Tagliati, S ^a   Rydh, A ^a   Xie, R ^b   Welp, U ^b   Kwok, W K ^b  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FABRICATION; FILM THICKNESS; LATENT HEAT; RESEARCH LABORATORIES; SILICON NITRIDE; SPECIFIC HEAT;

ABSOLUTE ACCURACY; DIFFERENTIAL CALORIMETERS; NANO-FABRICATION METHODS; RELAXATION METHODS; RELAXATION STUDIES; SILICON NITRIDE MEMBRANE; THERMAL CONDUCTANCE; THIN FILM HEATERS;

CALORIMETERS;

EID: 77952506410     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/150/5/052256     Document Type: Conference Paper

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