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Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Volumn 30, Issue 2, 2012, Pages

Characterization of carbon nanotube film-silicon Schottky barrier photodetectors

(4) An, Yanbin a Rao, Hemant a Bosman, Gijs a Ural, Ant a

a J Crayton Pruitt Family Department of Biomedical Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTODETECTORS; SCHOTTKY BARRIER DIODES; SILICON; SINGLE-WALLED CARBON NANOTUBES (SWCN);

CNT FILMS; CONVENTIONAL METALS; CURRENT RATIOS; CURRENT VOLTAGE; HIGH TRANSMITTANCE; MEASURED CURRENTS; NOISE EQUIVALENT POWER; NOISE PROPERTIES; RESPONSIVITY; REVERSE BIAS; SCHOTTKY BARRIERS; SINGLE-WALLED CARBON; SPECTRAL RESPONSIVITY; TRANSPARENT METALS;

SEMICONDUCTING SILICON;

EID: 84861591904 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3690645 Document Type: Article

Times cited : (27)

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